Radiation effects and soft errors in integrated circuits and electronic devices /
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative en...
Clasificación: | Libro Electrónico |
---|---|
Otros Autores: | Schrimpf, Ronald Donald, Fleetwood, D. M. (Dan M.) |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Singapore ; New Jersey :
World Scientific Pub.,
©2004.
|
Colección: | Selected topics in electronics and systems ;
vol. 34. |
Temas: | |
Acceso en línea: | Texto completo |
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