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Radiation effects and soft errors in integrated circuits and electronic devices /
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative en...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Singapore ; New Jersey :
World Scientific Pub.,
©2004.
|
| Colección: | Selected topics in electronics and systems ;
vol. 34. |
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
| LEADER | 00000cam a2200000Ma 4500 | ||
|---|---|---|---|
| 001 | EBSCO_ocn646769029 | ||
| 003 | OCoLC | ||
| 005 | 20231017213018.0 | ||
| 006 | m o d | ||
| 007 | cr cn||||||||| | ||
| 008 | 060316s2004 si a ob 000 0 eng d | ||
| 010 | |z 2006273469 | ||
| 040 | |a E7B |b eng |e pn |c E7B |d OCLCQ |d N$T |d YDXCP |d UBY |d IDEBK |d OCLCQ |d OCLCO |d EBLCP |d DEBSZ |d OCLCQ |d AZK |d LOA |d JBG |d COCUF |d AGLDB |d MOR |d CCO |d PIFAG |d ZCU |d OTZ |d MERUC |d OCLCQ |d U3W |d OCLCF |d STF |d WRM |d OCLCQ |d VTS |d NRAMU |d ICG |d INT |d VT2 |d OCLCQ |d WYU |d OCLCQ |d DKC |d AU@ |d OCLCQ |d M8D |d UKAHL |d OCLCQ |d LEAUB |d UKCRE |d AJS |d OCLCO |d OCLCQ |d OCLCO | ||
| 016 | 7 | |a 013036621 |2 Uk | |
| 019 | |a 261583698 |a 505144459 |a 764502834 |a 879074235 |a 961530187 |a 962725772 |a 968284134 |a 988449270 |a 991916305 |a 994954598 |a 1037750456 |a 1038577142 |a 1045485354 |a 1055397339 |a 1062892012 |a 1063816267 |a 1081263584 |a 1086439870 |a 1153557598 | ||
| 020 | |a 9789812794703 |q (electronic bk.) | ||
| 020 | |a 9812794700 |q (electronic bk.) | ||
| 020 | |z 9789812389404 | ||
| 020 | |z 9812389407 | ||
| 029 | 1 | |a AU@ |b 000049163052 | |
| 029 | 1 | |a AU@ |b 000051406405 | |
| 029 | 1 | |a AU@ |b 000058360246 | |
| 029 | 1 | |a DEBBG |b BV043146983 | |
| 029 | 1 | |a DEBBG |b BV044178861 | |
| 029 | 1 | |a DEBSZ |b 422100331 | |
| 029 | 1 | |a DEBSZ |b 431677093 | |
| 029 | 1 | |a NZ1 |b 13858255 | |
| 035 | |a (OCoLC)646769029 |z (OCoLC)261583698 |z (OCoLC)505144459 |z (OCoLC)764502834 |z (OCoLC)879074235 |z (OCoLC)961530187 |z (OCoLC)962725772 |z (OCoLC)968284134 |z (OCoLC)988449270 |z (OCoLC)991916305 |z (OCoLC)994954598 |z (OCoLC)1037750456 |z (OCoLC)1038577142 |z (OCoLC)1045485354 |z (OCoLC)1055397339 |z (OCoLC)1062892012 |z (OCoLC)1063816267 |z (OCoLC)1081263584 |z (OCoLC)1086439870 |z (OCoLC)1153557598 | ||
| 050 | 4 | |a TK7870.285 |b .R33 2004eb | |
| 072 | 7 | |a TEC |x 008020 |2 bisacsh | |
| 072 | 7 | |a TEC |x 008010 |2 bisacsh | |
| 082 | 0 | 4 | |a 621.3815 |2 22 |
| 049 | |a UAMI | ||
| 245 | 0 | 0 | |a Radiation effects and soft errors in integrated circuits and electronic devices / |c editors, R.D. Schrimpf, D.M. Fleetwood. |
| 260 | |a Singapore ; |a New Jersey : |b World Scientific Pub., |c ©2004. | ||
| 300 | |a 1 online resource (viii, 339 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a Selected topics in electronics and systems ; |v vol. 34 | |
| 504 | |a Includes bibliographical references. | ||
| 588 | 0 | |a Print version record. | |
| 505 | 0 | |a Preface; CONTENTS; Single Event Effects in Avionics and on the Ground; 1. Introduction; 2. Similarities between SEE in Avionics and on the Ground; 3. Differences Between SEE in Avionics and on the Ground; 4. Atmospheric and Ground Level Environments; 5. SEE Data in devices; 6. Summary; Soft Errors in Commercial Integrated Circuits; 1. Introduction; 2. Scaling trends for memory devices; 3. Seating trend for peripheral logic devices; 4. Conclusion; Single-Event Effects in lll-V Semiconductor Electronics; 1. Introduction; 2. Single-Event Effects in lll-V Electronic Devices. | |
| 505 | 8 | |a 3. Summary and ConclusionsInvestigation of Single-Event Transients in Fast Integrated Circuits with a Pulsed Laser; 1. Basic Mechanisms of a SET; 2. SET Laser Testing; 3. Experimental set-up for SET laser testing; 4. Results; 5. Conclusions; System Level Single Event Upset Mitigation Strategies; 1. Introduction; 2. Systems Engineering for Energetic Particle Environment Compatibility; 3. Fault Tolerant Systems Strategies; Radiation-Tolerant Design for High Performance Mixed-Signal Circuits; 1. Introduction; 2. Radiation Mechanisms in Mixed-Signal Integrated Circuits. | |
| 505 | 8 | |a 3. Process Component and Layout Choices for Hardened-by-Design Circuits4. Total Dose Hardening; 5. Single-Event Effect Hardening; 6. Dose-Rate Effect Hardening; 7. Conclusion; A Total-Dose Hardening-By-Design Approach for High-Speed Mixed-Signal CMOS Integrated Circuits; 1. Introduction; 2. Closed Geometry Transistors; 3. Circuit Application-Functional Description; 4. Performance of HBD APHY Circuit; 5. Conclusions; Radiation Issues in the New Generation of High Energy Physics Experiments; 1. Introduction; 2. The Radiation Environment; 3. SEU Rate Estimate in the LHC. | |
| 505 | 8 | |a 4. Radiation-Hard ASICs Design5. Conclusions; Space Radiation Effects in Optocouplers; 1.0 Introduction; 2.0 Optocoupter Types Addressed in This Paper; 3.0 Physical Mechanisms of Particle-Induced Transient Effects; 4.0 Physical Mechanisms for Permanent Degradation; 5.0 Conclusions; Radiation Effects in Charge-Coupled Device (CCD) Imagers and CMOS Active Pixel Sensors; 1. Introduction; 2. Damage due to Total Ionizing Dose (TTD); 3. Displacement Damage; 4. Transient Events; 5. Future Work; The Effects of Space Radiation Exposure on Power MOSFETs: A Review; 1. Introduction. | |
| 505 | 8 | |a 2. Power MOSFET Technotogies3. Total Dose Ionizing Radiation Effects on Power MOSFETs; 4. Single Event Radiation Effects; 5. Conclusions; Introduction to SOI MOSFETs: Context Radiation Effects and Future Trends; 1. Introduction; 2. Current Status of SOI Technology; 3. Operation Mechanisms in SOI MOSFETs; 4. Radiation Effects on SOI MOSFETs; 5. Future Trends; 6. Conclusions; Total-Dose and Single-Event Effects in Silicon-Germanium Heterojunction Bipolar Transistors; 1. Introduction; 2. The SiGe HBT; 3. Radiation Response of SiGe HBTs; 4. SiGe HBT Circuit Tolerance. | |
| 520 | |a This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes th. | ||
| 590 | |a eBooks on EBSCOhost |b EBSCO eBook Subscription Academic Collection - Worldwide | ||
| 650 | 0 | |a Electronic circuits |x Effect of radiation on. | |
| 650 | 0 | |a Integrated circuits |x Effect of radiation on. | |
| 650 | 6 | |a Circuits électroniques |x Effets du rayonnement sur. | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Electronics |x Circuits |x Integrated. |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Electronics |x Circuits |x General. |2 bisacsh | |
| 650 | 7 | |a Integrated circuits |x Effect of radiation on |2 fast | |
| 700 | 1 | |a Schrimpf, Ronald Donald. | |
| 700 | 1 | |a Fleetwood, D. M. |q (Dan M.) | |
| 776 | 0 | 8 | |i Print version: |t Radiation effects and soft errors in integrated circuits and electronic devices. |d Singapore ; New Jersey : World Scientific Pub., ©2004 |w (DLC) 2006273469 |
| 830 | 0 | |a Selected topics in electronics and systems ; |v vol. 34. | |
| 856 | 4 | 0 | |u https://ebsco.uam.elogim.com/login.aspx?direct=true&scope=site&db=nlebk&AN=235566 |z Texto completo |
| 938 | |a Askews and Holts Library Services |b ASKH |n AH24685124 | ||
| 938 | |a ProQuest Ebook Central |b EBLB |n EBL1679457 | ||
| 938 | |a ebrary |b EBRY |n ebr10255983 | ||
| 938 | |a EBSCOhost |b EBSC |n 235566 | ||
| 938 | |a YBP Library Services |b YANK |n 2889291 | ||
| 994 | |a 92 |b IZTAP | ||