Radiation effects and soft errors in integrated circuits and electronic devices /

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This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative en...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Schrimpf, Ronald Donald, Fleetwood, D. M. (Dan M.)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Singapore ; New Jersey : World Scientific Pub., ©2004.
Colección:Selected topics in electronics and systems ; vol. 34.
Temas:
Electronic circuits > Effect of radiation on.
Integrated circuits > Effect of radiation on.
Circuits électroniques > Effets du rayonnement sur.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > Integrated.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > General.
Integrated circuits > Effect of radiation on
Acceso en línea:Texto completo
Descripción
Sumario:This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes th.
Descripción Física:1 online resource (viii, 339 pages) : illustrations
Bibliografía:Includes bibliographical references.
ISBN:9789812794703
9812794700

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