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Advanced mathematical & computational tools in metrology VI /
This volume collects refereed contributions based on the presentations made at the Sixth Workshop on Advanced Mathematical and Computational Tools in Metrology, held at the Istituto di Metrologia "G. Colonnetti" (IMGC), Torino, Italy, in September 2003. It provides a forum for metrologists...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Singapore ; River Edge, NJ :
World Scientific,
©2004.
|
| Colección: | Series on advances in mathematics for applied sciences ;
v. 66. |
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 245 | 0 | 0 | |a Advanced mathematical & computational tools in metrology VI / |c editors, P. Ciarlini [and others]. |
| 260 | |a Singapore ; |a River Edge, NJ : |b World Scientific, |c ©2004. | ||
| 300 | |a 1 online resource (x, 350 pages) : |b illustrations. | ||
| 336 | |a text |b txt |2 rdacontent | ||
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| 490 | 1 | |a Series on advances in mathematics for applied sciences ; |v v. 66 | |
| 504 | |a Includes bibliographical references and index. | ||
| 588 | 0 | |a Print version record. | |
| 505 | 0 | |a Estimation of precision and uncertainty of a calibration artefact for CMMs / S.D. Antunes and M.A.E Vicente -- Uncertainty in semi-qualitative testing / W. Bremser and W. Hässelbarth -- Processing the coherent anomalies on digitalized surfaces in wavelet domain / P. Ciarlini and M.L. Lo Cascio -- Least squares adjustment in the presence of discrepant data / M.G. Cox [and others] -- Harmonization of correlated calibration curves with an application to the analysis of natural gases / M.G. Cox [and others] -- Parametrized approximation estimators for mixed noise distributions / D.P. Jenkinson [and others] -- Algorithms for the calibration of laser-plane sensors on CMMs / C. Lartigue [and others] -- Some differences between the applied statistical approach for measurement uncertainty theory and the traditional approach in metrology and testing / C. Perruchet -- Metrology software for the expression of measurement results by direct calculation of probability distributions / G.B. Rossi, E. Crenna and M. Codda -- Feasibility study of using bootstrap to compute the uncertainty contribution from few repeated measurements / B.R.L. Siebert and P. Ciarlini -- Recursive and parallel algorithms for approximating surface data on a family of lines or curves / G. Allasia -- Process measurement impact on the verification uncertainty / J. Bachmann [and others] -- On the in-use uncertainty of an instrument / W. Bich and F. Pennecchi -- Automatic differentiation and its application in metrology / R. Boudjemaa [and others] -- Usage of non-central probability distributions for data analysis in metrology / A. Chunovkina -- Implementation of a general least squares method in mass measurements / J. Hald and L. Nielsen -- The GUM tree design pattern for uncertainty software / B.D. Hall -- Statistical hypotheses testing for phase transition identification in cryogenic thermometry / D. Ichim, I. Peroni and F. Sparasci -- The impact of entropy optimization principles on the probability assignment to the measurement uncertainty / G. Iuculano, A. Zanobini and G. Pellegrini -- Stochastic processes for modelling and evaluating atomic clock behaviour / G. Panfilo, P. Tavella and C. Zucca. | |
| 505 | 8 | |a Compound-modelling of metrological data series / F. Pavese -- Homotopic solution of EW-TLS problems / M.L. Rastello and A. Premoli -- Pooled data distributions: graphical and statistical tools for examining comparison reference values / A.G. Steele, K.D. Hill and R.J. Douglas -- Numerical uncertainty evaluation for complex-valued quantities: a case example / L. Callegaro, F Pennecchi and W. Bich -- Bayesian approach to quantum state tomography / S. Castelletto [and others] -- Simulation of charge transfer in a tunnel junction: approaching the sub-e scale / G.E. D'Errico -- Validation of calibration methods -- a practical approach / E. Filipe -- Comparison of LS techniques for the linear approximation of data affected by heteroschedastic errors in both variables with uncertainty estimation / D. Ichim [and others] -- Noise correction for surface measurements / H. Haitjema and M.A.A. Morel -- Evaluation of uncertainty of standard platinum resistance thermometer at national laboratory level / M.J. Korczynski [and others] -- A new approach to the presentation of the result measurements in virtual instruments / M.J. Korczynski and A. Hetman -- A hybrid method for [symbol] approximation / D. Lei and J.C. Mason -- Interpolation equations for industrial platinum resistance thermometers / P. Marcarino, P.P.M. Steur and A. Merlone -- From the fixed points calibration to the certificate: a completely automated temperature laboratory / A. Merlone [and others] -- A new off-line gain stabilisation method applied to alpha-particle spectrometry / S. Pommé and G. Sibbens -- Development of software for ANOVA that can generate expressions of variance expectations / H. Tanaka, T. Kamoshita and K. Ehara -- Template matching in passive sonar recognition / J.L. Terry, D.A. Turner and J.C. Mason -- Fast computational alternative to Monte Carlo simulation of an output distribution / R.D. Willink and B.D. Hall -- Short course on uncertainty evaluation / M.G. Cox -- Software requirements in legal metrology: short course held adjacent to the conference / D. Richter. | |
| 520 | |a This volume collects refereed contributions based on the presentations made at the Sixth Workshop on Advanced Mathematical and Computational Tools in Metrology, held at the Istituto di Metrologia "G. Colonnetti" (IMGC), Torino, Italy, in September 2003. It provides a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources, and promotes collaboration in the context of EU programmes, EUROMET and EA projects, and MRA requirements. It contains articles by an important, worldwide group of metrologists and mathematicians involved in measurement science and, together with the five previous volumes in this series, constitutes an authoritative source for the mathematical, statistical and software tools necessary to modern metrology. | ||
| 546 | |a English. | ||
| 590 | |a eBooks on EBSCOhost |b EBSCO eBook Subscription Academic Collection - Worldwide | ||
| 650 | 0 | |a Measurement |v Congresses. | |
| 650 | 0 | |a Physical measurements |v Congresses. | |
| 650 | 6 | |a Mesure |v Congrès. | |
| 650 | 6 | |a Mesures physiques |v Congrès. | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Measurement. |2 bisacsh | |
| 650 | 7 | |a MATHEMATICS |x Measurement. |2 bisacsh | |
| 650 | 7 | |a Measurement |2 fast | |
| 650 | 7 | |a Physical measurements |2 fast | |
| 653 | 1 | |a Metrology | |
| 655 | 7 | |a Conference papers and proceedings |2 fast | |
| 700 | 1 | |a Ciarlini, P. | |
| 776 | 0 | 8 | |i Print version: |t Advanced mathematical & computational tools in metrology VI. |d Singapore ; River Edge, NJ : World Scientific, ©2004 |w (DLC) 2006298164 |
| 830 | 0 | |a Series on advances in mathematics for applied sciences ; |v v. 66. | |
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