Oxide reliability : a summary of silicon oxide wearout, breakdown, and reliability /

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Annotation This book presents in summary the state of our knowledge of oxide reliability. The articles have been written by experts who are among the most knowledgeable in the field. The book will be an invaluable aid to reliability engineers and manufacturing engineers, helping them to produce and...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Dumin, D. J.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: [River Edge, NJ] : World Scientific, ©2002.
Colección:Selected topics in electronics and systems ; v. 23.
Temas:
Metal oxide semiconductors > Reliability.
Silicon oxide > Deterioration.
MOS (Électronique) > Fiabilité.
Silice > Détérioration.
COMPUTERS > Machine Theory.
COMPUTERS > Computer Engineering.
COMPUTERS > Hardware > General.
Metal oxide semiconductors > Reliability
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Oxide wearout, breakdown, and reliability / D.J. Dumin
  • Reliability of flash nonvolatile memories / N. Mielke and J. Chen
  • Physics and chemistry of intrinsic time-dependent dielectric breakdown in SiO2 dielectrics / J.W. McPherson
  • Breakdown modes and breakdown statistics of ultrathin SiO2 gate oxides / J. Sune, D. Jimenez, and E. Miranda
  • MOSFET gate oxide reliability: Anode hole injection model and its applications / Y.-C. Yeo, Q. Lu, and C. Hu.

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