Microelectronic failure analysis : desk reference : 2002 supplement /

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: Electronic Device Failure Analysis Society
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Materials Park, Ohio : ASM International, ©2002.
Temas:
Electronics > Materials > Testing > Handbooks, manuals, etc.
Microelectronics > Materials > Testing > Handbooks, manuals, etc.
Microelectronics > Materials > Defects > Handbooks, manuals, etc.
Electronic apparatus and appliances > Testing > Handbooks, manuals, etc.
Semiconductors > Defects > Handbooks, manuals, etc.
Microélectronique > Défauts > Guides, manuels, etc.
Appareils électroniques > Essais > Guides, manuels, etc.
Semi-conducteurs > Défauts > Guides, manuels, etc.
TECHNOLOGY & ENGINEERING > Electronics > Digital.
TECHNOLOGY & ENGINEERING > Electronics > Microelectronics.
Electronic apparatus and appliances > Testing.
Electronics > Materials > Testing.
Microelectronics > Materials > Defects.
Microelectronics > Materials > Testing.
Semiconductors > Defects.
Handbooks and manuals.
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Preface
  • Contents
  • Analysis for Submicron Defects
  • Failure Analysis of Microelectricalmechanical Systems (MEMS)
  • Leading Edge Circuit Board Fault Localization/Failure Analysis
  • Failure Analysis of Passive Componenets and Thick Film Hybrids
  • Reference Information
  • GoFATA Glossary of Failure Analysis Tool Acronyms
  • ISTFA Subject Index

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