|
|
|
|
| LEADER |
00000cam a2200000Ia 4500 |
| 001 |
EBSCO_ocn609419839 |
| 003 |
OCoLC |
| 005 |
20231017213018.0 |
| 006 |
m o d |
| 007 |
cr cnu---unuuu |
| 008 |
100426s2002 ohua obf 001 0 eng d |
| 040 |
|
|
|a OCLCE
|b eng
|e pn
|c OCLCE
|d OCLCQ
|d E7B
|d OCLCQ
|d N$T
|d B24X7
|d OCLCQ
|d NLGGC
|d DEBSZ
|d YDXCP
|d D6H
|d OCLCF
|d OCL
|d EBLCP
|d OCLCQ
|d LOA
|d JBG
|d AGLDB
|d MOR
|d PIFAG
|d ZCU
|d MERUC
|d OCLCQ
|d U3W
|d STF
|d WRM
|d OCLCQ
|d VTS
|d NRAMU
|d ICG
|d INT
|d VT2
|d AU@
|d OCLCQ
|d DKC
|d OCLCQ
|d UKCRE
|d AJS
|d HS0
|d OCLCQ
|d OCLCO
|d M8D
|d OCLCO
|d OCLCQ
|
| 019 |
|
|
|a 606899822
|a 764526644
|a 773176612
|a 961551248
|a 962618460
|a 966211922
|a 975207309
|a 975241698
|a 988514940
|a 992035767
|a 999656922
|a 1002390330
|a 1018022660
|a 1037915705
|a 1038041231
|a 1038596911
|a 1041916362
|a 1045483430
|a 1047936706
|a 1053528217
|a 1055356881
|a 1058030612
|a 1081217023
|a 1100518130
|a 1153544162
|a 1156967679
|a 1228618548
|a 1248629098
|
| 020 |
|
|
|a 9781615032648
|q (electronic bk.)
|
| 020 |
|
|
|a 1615032649
|q (electronic bk.)
|
| 020 |
|
|
|z 0871707691
|
| 020 |
|
|
|z 9780871707697
|
| 029 |
1 |
|
|a AU@
|b 000053269297
|
| 029 |
1 |
|
|a DEBBG
|b BV043136083
|
| 029 |
1 |
|
|a DEBBG
|b BV044182357
|
| 029 |
1 |
|
|a DEBSZ
|b 421522828
|
| 029 |
1 |
|
|a NZ1
|b 13861236
|
| 035 |
|
|
|a (OCoLC)609419839
|z (OCoLC)606899822
|z (OCoLC)764526644
|z (OCoLC)773176612
|z (OCoLC)961551248
|z (OCoLC)962618460
|z (OCoLC)966211922
|z (OCoLC)975207309
|z (OCoLC)975241698
|z (OCoLC)988514940
|z (OCoLC)992035767
|z (OCoLC)999656922
|z (OCoLC)1002390330
|z (OCoLC)1018022660
|z (OCoLC)1037915705
|z (OCoLC)1038041231
|z (OCoLC)1038596911
|z (OCoLC)1041916362
|z (OCoLC)1045483430
|z (OCoLC)1047936706
|z (OCoLC)1053528217
|z (OCoLC)1055356881
|z (OCoLC)1058030612
|z (OCoLC)1081217023
|z (OCoLC)1100518130
|z (OCoLC)1153544162
|z (OCoLC)1156967679
|z (OCoLC)1228618548
|z (OCoLC)1248629098
|
| 042 |
|
|
|a dlr
|
| 050 |
|
4 |
|a TK7871
|b .M52 2002eb
|
| 072 |
|
7 |
|a TEC
|x 008060
|2 bisacsh
|
| 072 |
|
7 |
|a TEC
|x 008070
|2 bisacsh
|
| 082 |
0 |
4 |
|a 621.381
|2 23
|
| 049 |
|
|
|a UAMI
|
| 245 |
0 |
0 |
|a Microelectronic failure analysis :
|b desk reference : 2002 supplement /
|c prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee.
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| 260 |
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|a Materials Park, Ohio :
|b ASM International,
|c ©2002.
|
| 300 |
|
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|a 1 online resource (vi, 210 pages) :
|b illustrations
|
| 336 |
|
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|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a computer
|b c
|2 rdamedia
|
| 338 |
|
|
|a online resource
|b cr
|2 rdacarrier
|
| 504 |
|
|
|a Includes bibliographical references and index.
|
| 588 |
0 |
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|a Print version record.
|
| 506 |
|
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|3 Use copy
|f Restrictions unspecified
|2 star
|5 MiAaHDL
|
| 533 |
|
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|a Electronic reproduction.
|b [Place of publication not identified] :
|c HathiTrust Digital Library,
|d 2010.
|5 MiAaHDL
|
| 538 |
|
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|a Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
|u http://purl.oclc.org/DLF/benchrepro0212
|5 MiAaHDL
|
| 583 |
1 |
|
|a digitized
|c 2010
|h HathiTrust Digital Library
|l committed to preserve
|2 pda
|5 MiAaHDL
|
| 505 |
0 |
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|a Preface -- Contents -- Analysis for Submicron Defects -- Failure Analysis of Microelectricalmechanical Systems (MEMS) -- Leading Edge Circuit Board Fault Localization/Failure Analysis -- Failure Analysis of Passive Componenets and Thick Film Hybrids -- Reference Information -- GoFATA Glossary of Failure Analysis Tool Acronyms -- ISTFA Subject Index
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| 590 |
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|a eBooks on EBSCOhost
|b EBSCO eBook Subscription Academic Collection - Worldwide
|
| 650 |
|
0 |
|a Electronics
|x Materials
|x Testing
|v Handbooks, manuals, etc.
|
| 650 |
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0 |
|a Microelectronics
|x Materials
|x Testing
|v Handbooks, manuals, etc.
|
| 650 |
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0 |
|a Microelectronics
|x Materials
|x Defects
|v Handbooks, manuals, etc.
|
| 650 |
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0 |
|a Electronic apparatus and appliances
|x Testing
|v Handbooks, manuals, etc.
|
| 650 |
|
0 |
|a Semiconductors
|x Defects
|v Handbooks, manuals, etc.
|
| 650 |
|
6 |
|a Microélectronique
|x Défauts
|v Guides, manuels, etc.
|
| 650 |
|
6 |
|a Appareils électroniques
|x Essais
|v Guides, manuels, etc.
|
| 650 |
|
6 |
|a Semi-conducteurs
|x Défauts
|v Guides, manuels, etc.
|
| 650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Electronics
|x Digital.
|2 bisacsh
|
| 650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Electronics
|x Microelectronics.
|2 bisacsh
|
| 650 |
|
7 |
|a Electronic apparatus and appliances
|x Testing.
|2 fast
|0 (OCoLC)fst00906837
|
| 650 |
|
7 |
|a Electronics
|x Materials
|x Testing.
|2 fast
|0 (OCoLC)fst00907571
|
| 650 |
|
7 |
|a Microelectronics
|x Materials
|x Defects.
|2 fast
|0 (OCoLC)fst01019772
|
| 650 |
|
7 |
|a Microelectronics
|x Materials
|x Testing.
|2 fast
|0 (OCoLC)fst01019774
|
| 650 |
|
7 |
|a Semiconductors
|x Defects.
|2 fast
|0 (OCoLC)fst01112211
|
| 655 |
|
7 |
|a Handbooks and manuals.
|2 fast
|0 (OCoLC)fst01423877
|
| 710 |
2 |
|
|a Electronic Device Failure Analysis Society.
|
| 776 |
0 |
8 |
|i Print version:
|t Microelectronic failure analysis.
|d Materials Park, Ohio : ASM International, ©2002
|w (OCoLC)51259869
|
| 856 |
4 |
0 |
|u https://ebsco.uam.elogim.com/login.aspx?direct=true&scope=site&db=nlebk&AN=395856
|z Texto completo
|
| 938 |
|
|
|a Books 24x7
|b B247
|n bke00042663
|
| 938 |
|
|
|a ebrary
|b EBRY
|n ebr10330016
|
| 938 |
|
|
|a EBSCOhost
|b EBSC
|n 395856
|
| 938 |
|
|
|a YBP Library Services
|b YANK
|n 3623612
|
| 994 |
|
|
|a 92
|b IZTAP
|
