Monte Carlo modeling for electron microscopy and microanalysis /

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1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and I...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Joy, David C., 1943-
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York : Oxford University Press, 1995.
Colección:Oxford series in optical and imaging sciences ; 9.
Temas:
Electron microscopy > Computer simulation.
Electron probe microanalysis > Computer simulation.
Monte Carlo method.
Monte Carlo Method
Microscopie électronique > Simulation par ordinateur.
Microanalyse par sonde électronique > Simulation par ordinateur.
Méthode de Monte-Carlo.
SCIENCE > Electron Microscopes & Microscopy.
Electron microscopy
Acceso en línea:Texto completo
Descripción
Sumario:1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and Imaging. 10. X-Ray Production and Micro-Analysis. 11. What Next in Monte Carlo Simulations?
Descripción Física:1 online resource (viii, 216 pages) : illustrations
Bibliografía:Includes bibliographical references and index.
ISBN:9780195358469
0195358465

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