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Advanced production testing of RF, SoC, and SiP devices /

Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that ar...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Kelly, Joe, Ph. D.
Otros Autores: Engelhardt, M. (Michael)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Boston : Artech House, ©2007.
Colección:Artech House microwave library.
Temas:
Acceso en línea:Texto completo