Cargando…
Advanced production testing of RF, SoC, and SiP devices /
Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that ar...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Boston :
Artech House,
©2007.
|
| Colección: | Artech House microwave library.
|
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
| LEADER | 00000cam a2200000 a 4500 | ||
|---|---|---|---|
| 001 | EBSCO_ocn228292434 | ||
| 003 | OCoLC | ||
| 005 | 20231017213018.0 | ||
| 006 | m o d | ||
| 007 | cr cnu---unuuu | ||
| 008 | 080519s2007 maua ob 001 0 eng d | ||
| 040 | |a N$T |b eng |e pn |c N$T |d OCLCQ |d COCUF |d COO |d QE2 |d OCLCQ |d OCLCA |d B24X7 |d OCLCQ |d E7B |d OCLCO |d OCLCA |d P4I |d OCLCQ |d CLL |d CCO |d DKDLA |d FVL |d YDXCP |d OCLCQ |d AZK |d LOA |d JBG |d CNNOR |d MOR |d PIFAG |d PIFBR |d OCLCQ |d WY@ |d U3W |d BRL |d STF |d WRM |d VTS |d AGLDB |d INT |d VT2 |d CUY |d OCLCQ |d WYU |d A6Q |d OCLCQ |d REC |d M8D |d UKAHL |d HS0 |d UKCRE |d IEEEE |d OCLCO |d OCLCQ |d OCLCO |d ANO |d OCLCQ |d OCLCO | ||
| 016 | 7 | |a 013614722 |2 Uk | |
| 019 | |a 290537586 |a 471135823 |a 475404007 |a 475615103 |a 567967770 |a 648366990 |a 722650416 |a 728035893 |a 961545316 |a 962667980 |a 966221997 |a 988494459 |a 991952916 |a 992051192 |a 1037507491 |a 1038671517 |a 1055354253 |a 1065029888 |a 1076290450 |a 1081288360 |a 1153524216 |a 1228588614 | ||
| 020 | |a 9781580537100 |q (electronic bk.) | ||
| 020 | |a 1580537103 |q (electronic bk.) | ||
| 020 | |z 158053709X | ||
| 020 | |z 9781580537094 | ||
| 029 | 1 | |a AU@ |b 000051428593 | |
| 029 | 1 | |a DEBBG |b BV043064421 | |
| 029 | 1 | |a DEBSZ |b 422136301 | |
| 029 | 1 | |a GBVCP |b 802577946 | |
| 029 | 1 | |a NZ1 |b 14239353 | |
| 035 | |a (OCoLC)228292434 |z (OCoLC)290537586 |z (OCoLC)471135823 |z (OCoLC)475404007 |z (OCoLC)475615103 |z (OCoLC)567967770 |z (OCoLC)648366990 |z (OCoLC)722650416 |z (OCoLC)728035893 |z (OCoLC)961545316 |z (OCoLC)962667980 |z (OCoLC)966221997 |z (OCoLC)988494459 |z (OCoLC)991952916 |z (OCoLC)992051192 |z (OCoLC)1037507491 |z (OCoLC)1038671517 |z (OCoLC)1055354253 |z (OCoLC)1065029888 |z (OCoLC)1076290450 |z (OCoLC)1081288360 |z (OCoLC)1153524216 |z (OCoLC)1228588614 | ||
| 050 | 4 | |a TK7895.E42 |b K45 2007eb | |
| 072 | 7 | |a TEC |x 008020 |2 bisacsh | |
| 072 | 7 | |a TEC |x 008010 |2 bisacsh | |
| 082 | 0 | 4 | |a 621.3815 |2 22 |
| 049 | |a UAMI | ||
| 100 | 1 | |a Kelly, Joe, |c Ph. D. | |
| 245 | 1 | 0 | |a Advanced production testing of RF, SoC, and SiP devices / |c Joe Kelly, Michael Engelhardt. |
| 260 | |a Boston : |b Artech House, |c ©2007. | ||
| 300 | |a 1 online resource (xx, 301 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 347 | |a data file | ||
| 490 | 1 | |a Artech House microwave library | |
| 504 | |a Includes bibliographical references and index. | ||
| 588 | 0 | |a Print version record. | |
| 520 | 3 | |a Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that are critical to their work involving semiconductor devices. The book covers key measurement concepts for semiconductor device testing and assists engineers in explaining these concepts to management to aid in the reduction of project cost, time, and resources. Based on real-world experience and packed with time-saving equations, this in-depth volume offers professionals practical information on essential topics that have never been presented in a single reference before. |c Publisher abstract. | |
| 505 | 0 | |a Advanced Production Testing of RF, SoC, and SiP Devices; Contents vii; Preface xvii; Acknowledgments xix; 1 Concepts of Production Testing of RF, SoC, and SiP Devices 1; 2 Tests and Measurements I: Fundamental RF Measurements; 3 Tests and Measurements II: Distortion 35; 4 Tests and Measurements III: Noise 59; 5 Advances in Testing RF and SoC Devices 97; 6 Production Test Equipment; 7 Cost of Test 139; 8 Calibration 159; 9 Contactors 175; 10 Handlers 201; 11 Load Boards 221; 12 Wafer Probing 253; Appendix A Power and Voltage Conversions 265 | |
| 505 | 8 | |a Appendix B VSWR, Return Loss, and Reflection Coefficient 271Appendix C RF Coaxial Cables 275; Appendix D RF Connectors 277; Appendix E Decimal to Hexadecimal and ASCII Conversions 283; Appendix F Numerical Prefixes 287; About the Authors 289; Index 291 | |
| 590 | |a eBooks on EBSCOhost |b EBSCO eBook Subscription Academic Collection - Worldwide | ||
| 650 | 0 | |a Systems on a chip |x Testing. | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Electronics |x Circuits |x Integrated. |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Electronics |x Circuits |x General. |2 bisacsh | |
| 700 | 1 | |a Engelhardt, M. |q (Michael) | |
| 776 | 0 | 8 | |i Print version: |a Kelly, Joe. |t Advanced production testing of RF, SoC, and SiP devices. |d Boston : Artech House, ©2007 |z 158053709X |z 9781580537094 |w (DLC) 2007272451 |w (OCoLC)76944927 |
| 830 | 0 | |a Artech House microwave library. | |
| 856 | 4 | 0 | |u https://ebsco.uam.elogim.com/login.aspx?direct=true&scope=site&db=nlebk&AN=225173 |z Texto completo |
| 938 | |a Askews and Holts Library Services |b ASKH |n AH28881997 | ||
| 938 | |a Books 24x7 |b B247 |n bke00027218 | ||
| 938 | |a EBSCOhost |b EBSC |n 225173 | ||
| 938 | |a IEEE |b IEEE |n 9101170 | ||
| 938 | |a YBP Library Services |b YANK |n 2810972 | ||
| 994 | |a 92 |b IZTAP | ||