Scanning force microscopy : with applications to electric, magnetic, and atomic forces /

Mostrar otras versiones (1)
Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Sarid, Dror
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York : Oxford University Press, 1994.
Edición:Rev. ed.
Colección:Oxford series in optical and imaging sciences ; 5.
Temas:
Scanning force microscopy.
Surfaces (Physics)
Microscopie à effet de force et à balayage.
Surfaces (Physique)
SCIENCE > Microscopes & Microscopy.
Scanning force microscopy
Microscopia.
Microscopy
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Intro
  • Contents
  • PREFACE TO THE REVISED EDITION
  • PREFACE
  • PART ONE. LEVERS AND NOISE
  • Chapter 1 Mechanical Properties of Levers
  • 1.1. Introduction
  • 1.2. Stress and Strain
  • 1.3. Moments
  • 1.4. Spring Constant
  • 1.5. The Rayleigh Solution to a Vibrating Lever
  • 1.6. The Classical Solution to a Vibrating Lever
  • 1.7. Normal Modes
  • 1.8. Lumped Systems
  • 1.9. Examples
  • 1.10. Summary
  • Chapter 2 Resonance Enhancement
  • 2.1. Introduction
  • 2.2. Bimorph Driver
  • 2.3. Effective Spring Constant
  • 2.4. Bimorph-Driven Lever
  • 2.5. Sample-Driven Lever
  • 2.6. Tip-Driven Lever
  • 2.7. Summary
  • Chapter 3 Sources of Noise
  • 3.1. Introduction
  • 3.2. General Discussion of Noise
  • 3.3. Shot Noise
  • 3.4. Resistor Johnson Noise
  • 3.5. Laser Intensity Noise
  • 3.6. Laser Phase Noise
  • 3.7. Thermally Induced Lever Noise
  • 3.8. Bimorph Noise
  • 3.9. Lever Noise-Limited SNR
  • 3.10. Experimental Characterization of Noise
  • 3.11. Summary
  • PART TWO. SCANNING FORCE MICROSCOPES
  • Chapter 4 Tunneling Detection System
  • 4.1. Introduction
  • 4.2. Theory
  • 4.3. Perpendicular Arrangement
  • 4.4. Cross Arrangement
  • 4.5. Parallel Arrangement
  • 4.6. Serial Arrangement
  • 4.7. Single-Lever Arrangement
  • 4.8. Summary
  • Chapter 5 Capacitance Detection System
  • 5.1. Introduction
  • 5.2. Theory
  • 5.3. Noise Considerations
  • 5.4. Performance of Systems
  • 5.5. Summary
  • Chapter 6 Homodyne Detection System
  • 6.1. Introduction
  • 6.2. Theory
  • 6.3. Noise Considerations
  • 6.4. System Performance
  • 6.5. Summary
  • Chapter 7 Heterodyne Detection System
  • 7.1. Introduction
  • 7.2. Theory
  • 7.3. Noise Considerations
  • 7.4. Performance
  • 7.5. Summary
  • Chapter 8 Laser-Diode Feedback Detection System
  • 8.1. Introduction
  • 8.2. Theory
  • 8.3. Noise Considerations
  • 8.4. Performance
  • 8.5. Summary.
  • Chapter 9 Polarization Detection System
  • 9.1. Introduction
  • 9.2. Theory
  • 9.3. Noise Considerations
  • 9.4. Performance
  • 9.5. Summary
  • Chapter 10 Deflection Detection System
  • 10.1. Introduction
  • 10.2. Theory
  • 10.3. Noise Considerations
  • 10.4. Performance
  • 10.5. Summary
  • PART THREE. SCANNING FORCE MICROSCOPY
  • Chapter 11 Electric Force Microscopy
  • 11.1. Introduction
  • 11.2. Basic Concepts
  • 11.3. Examples
  • 11.4. Principles of Operation
  • 11.5. Noise Considerations
  • 11.6. Applications
  • 11.7. Performance
  • 11.8. Summary
  • Chapter 12 Magnetic Force Microscopy
  • 12.1. Introduction
  • 12.2. Basic Concepts
  • 12.3. Examples
  • 12.4. Principles of Operation
  • 12.5. Noise Considerations
  • 12.6. Applications
  • 12.7. Performance
  • 12.8. Summary
  • Chapter 13 Atomic Force Microscopy
  • 13.1. Introduction
  • 13.2. Intermolecular Microscopic Interactions
  • 13.3. Intermolecular Macroscopic Interactions
  • 13.4. Lever-Tip-Sample Contact Interactions
  • 13.5. Lever-Tip-Sample Noncontact Interactions
  • 13.6. Experimental Results for the Contact Mode
  • References
  • Index.

Ejemplares similares