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|a UAMI
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| 100 |
1 |
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|a Sarid, Dror.
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| 245 |
1 |
0 |
|a Scanning force microscopy :
|b with applications to electric, magnetic, and atomic forces /
|c Dror Sarid.
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| 250 |
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|a Rev. ed.
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| 260 |
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|a New York :
|b Oxford University Press,
|c 1994.
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| 300 |
|
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|a 1 online resource (xiii, 263 pages) :
|b illustrations
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| 336 |
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|a text
|b txt
|2 rdacontent
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| 337 |
|
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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| 347 |
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|a data file
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1 |
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|a Oxford series in optical and imaging sciences ;
|v 5
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| 504 |
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|a Includes bibliographical references (pages 233-259) and index.
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| 588 |
0 |
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|a Print version record.
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| 520 |
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|b This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. This revised edition updates the earlier such survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in SFM and a thoroughly revised bibliography. Academic and industrial researchers using SFM or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.
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| 505 |
0 |
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|a Intro -- Contents -- PREFACE TO THE REVISED EDITION -- PREFACE -- PART ONE. LEVERS AND NOISE -- Chapter 1 Mechanical Properties of Levers -- 1.1. Introduction -- 1.2. Stress and Strain -- 1.3. Moments -- 1.4. Spring Constant -- 1.5. The Rayleigh Solution to a Vibrating Lever -- 1.6. The Classical Solution to a Vibrating Lever -- 1.7. Normal Modes -- 1.8. Lumped Systems -- 1.9. Examples -- 1.10. Summary -- Chapter 2 Resonance Enhancement -- 2.1. Introduction -- 2.2. Bimorph Driver -- 2.3. Effective Spring Constant -- 2.4. Bimorph-Driven Lever -- 2.5. Sample-Driven Lever -- 2.6. Tip-Driven Lever -- 2.7. Summary -- Chapter 3 Sources of Noise -- 3.1. Introduction -- 3.2. General Discussion of Noise -- 3.3. Shot Noise -- 3.4. Resistor Johnson Noise -- 3.5. Laser Intensity Noise -- 3.6. Laser Phase Noise -- 3.7. Thermally Induced Lever Noise -- 3.8. Bimorph Noise -- 3.9. Lever Noise-Limited SNR -- 3.10. Experimental Characterization of Noise -- 3.11. Summary -- PART TWO. SCANNING FORCE MICROSCOPES -- Chapter 4 Tunneling Detection System -- 4.1. Introduction -- 4.2. Theory -- 4.3. Perpendicular Arrangement -- 4.4. Cross Arrangement -- 4.5. Parallel Arrangement -- 4.6. Serial Arrangement -- 4.7. Single-Lever Arrangement -- 4.8. Summary -- Chapter 5 Capacitance Detection System -- 5.1. Introduction -- 5.2. Theory -- 5.3. Noise Considerations -- 5.4. Performance of Systems -- 5.5. Summary -- Chapter 6 Homodyne Detection System -- 6.1. Introduction -- 6.2. Theory -- 6.3. Noise Considerations -- 6.4. System Performance -- 6.5. Summary -- Chapter 7 Heterodyne Detection System -- 7.1. Introduction -- 7.2. Theory -- 7.3. Noise Considerations -- 7.4. Performance -- 7.5. Summary -- Chapter 8 Laser-Diode Feedback Detection System -- 8.1. Introduction -- 8.2. Theory -- 8.3. Noise Considerations -- 8.4. Performance -- 8.5. Summary.
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| 505 |
8 |
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|a Chapter 9 Polarization Detection System -- 9.1. Introduction -- 9.2. Theory -- 9.3. Noise Considerations -- 9.4. Performance -- 9.5. Summary -- Chapter 10 Deflection Detection System -- 10.1. Introduction -- 10.2. Theory -- 10.3. Noise Considerations -- 10.4. Performance -- 10.5. Summary -- PART THREE. SCANNING FORCE MICROSCOPY -- Chapter 11 Electric Force Microscopy -- 11.1. Introduction -- 11.2. Basic Concepts -- 11.3. Examples -- 11.4. Principles of Operation -- 11.5. Noise Considerations -- 11.6. Applications -- 11.7. Performance -- 11.8. Summary -- Chapter 12 Magnetic Force Microscopy -- 12.1. Introduction -- 12.2. Basic Concepts -- 12.3. Examples -- 12.4. Principles of Operation -- 12.5. Noise Considerations -- 12.6. Applications -- 12.7. Performance -- 12.8. Summary -- Chapter 13 Atomic Force Microscopy -- 13.1. Introduction -- 13.2. Intermolecular Microscopic Interactions -- 13.3. Intermolecular Macroscopic Interactions -- 13.4. Lever-Tip-Sample Contact Interactions -- 13.5. Lever-Tip-Sample Noncontact Interactions -- 13.6. Experimental Results for the Contact Mode -- References -- Index.
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| 590 |
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|a eBooks on EBSCOhost
|b EBSCO eBook Subscription Academic Collection - Worldwide
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| 650 |
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0 |
|a Scanning force microscopy.
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| 650 |
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0 |
|a Surfaces (Physics)
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| 650 |
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|a Microscopie à effet de force et à balayage.
|
| 650 |
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6 |
|a Surfaces (Physique)
|
| 650 |
|
7 |
|a SCIENCE
|x Microscopes & Microscopy.
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|a Scanning force microscopy
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| 650 |
|
7 |
|a Surfaces (Physics)
|2 fast
|
| 650 |
|
7 |
|a Microscopia.
|2 larpcal
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| 653 |
0 |
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|a Microscopy
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| 776 |
0 |
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|i Print version:
|a Sarid, Dror.
|t Scanning force microscopy.
|b Rev. ed.
|d New York : Oxford University Press, 1994
|w (DLC) 94003081
|
| 830 |
|
0 |
|a Oxford series in optical and imaging sciences ;
|v 5.
|
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