Characterization of high Tc materials and devices by electron microscopy /

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This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron micros...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Browning, Nigel D., Pennycook, Stephen J.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Cambridge ; New York : Cambridge University Press, 2000.
Temas:
High temperature superconductors.
Electron microscopy > Technique.
Supraconducteurs à hautes températures.
Microscopie électronique > Technique.
TECHNOLOGY & ENGINEERING > Superconductors & Superconductivity.
Elektronenmikroskopie
Hochtemperatursupraleiter
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Cover; Half-title; Title; Copyright; Contents; Contributors; Preface; 1 High-resolution transmission electron microscopy; 2 Holography in the transmission electron microscope; 3 Microanalysis by scanning transmission electron microscopy; 4 Specimen preparation for transmission electron microscopy; 5 Low-temperature scanning electron microscopy; 6 Scanning tunneling microscopy; 7 Identification of new superconducting compounds by electron microscopy; 8 Valence band electron energy loss spectroscopy (EELS) of oxide superconductors.

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