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Principles of semiconductor network testing /
This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Boston :
Butterworth-Heinemann,
©1995.
©1995 |
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 037 | |a 94420:94419 |b Elsevier Science & Technology |n http://www.sciencedirect.com | ||
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| 100 | 1 | |a Afshar, Amir. | |
| 245 | 1 | 0 | |a Principles of semiconductor network testing / |c Amir Afshar. |
| 260 | |a Boston : |b Butterworth-Heinemann, |c ©1995. | ||
| 264 | 4 | |c ©1995 | |
| 300 | |a 1 online resource (xiv, 213 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
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| 504 | |a Includes bibliographical references and index. | ||
| 588 | 0 | |a Print version record. | |
| 505 | 0 | |a Front Cover; Principles of Semiconductor Network Testing; Copyright Page; Contents; Foreword; Preface; Chapter 1. Diode and Transistor Operation; Chapter 2. Integrated Circuit Test Basics; Chapter 3. Digital Logic Test; Chapter 4. Noise Identification; Chapter 5. Operational Amplifier; Chapter 6. Data Acquisition Devices; Chapter 7. Digital Signal Processing; Chapter 8. CODEC (Coder/Decoder); Index. | |
| 520 | |a This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources. | ||
| 506 | |3 Use copy |f Restrictions unspecified |2 star |5 MiAaHDL | ||
| 533 | |a Electronic reproduction. |b [S.l.] : |c HathiTrust Digital Library, |d 2010. |5 MiAaHDL | ||
| 538 | |a Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. |u http://purl.oclc.org/DLF/benchrepro0212 |5 MiAaHDL | ||
| 583 | 1 | |a digitized |c 2010 |h HathiTrust Digital Library |l committed to preserve |2 pda |5 MiAaHDL | |
| 590 | |a eBooks on EBSCOhost |b EBSCO eBook Subscription Academic Collection - Worldwide | ||
| 650 | 0 | |a Integrated circuits |x Testing. | |
| 650 | 0 | |a Semiconductors |x Testing. | |
| 650 | 6 | |a Semi-conducteurs |x Essais. | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Electronics |x Circuits |x Integrated. |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Electronics |x Circuits |x General. |2 bisacsh | |
| 650 | 7 | |a Integrated circuits |x Testing |2 fast | |
| 650 | 7 | |a Semiconductors |x Testing |2 fast | |
| 776 | 0 | 8 | |i Print version: |a Afshar, Amir. |t Principles of semiconductor network testing. |d Boston : Butterworth-Heinemann, ©1995 |z 0750694726 |z 9780750694728 |w (DLC) 95013386 |w (OCoLC)32275164 |
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