Testing of digital systems /

The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about how to test semiconductor devices and systems. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Jha, Niraj K.
Otros Autores: Gupta, S. (Sandeep), 1962-
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Cambridge : Cambridge University Press, 2003.
Temas:
Digital integrated circuits > Testing.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > Integrated.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > General.
Digital integrated circuits > Testing
Test
Digitale integrierte Schaltung
Acceso en línea:Texto completo
Tabla de Contenidos:
  • 1. Introduction / Ad van de Goor
  • 2. Fault models
  • 3. Combinational logic and fault simulation
  • 4. Test generation for combinational circuits
  • 5. Sequential ATPG
  • 6. I[subscript DDQ] testing
  • 7. Functional testing
  • 8. Delay fault testing
  • 9. CMOS testing
  • 10. Fault diagnosis
  • 11. Design for testability
  • 12. Built-in-self-test
  • 13. Synthesis for testability
  • 14. Memory testing / Ad van de Goor
  • 15. High-level test synthesis
  • 16. System-on-a-chip test synthesis.

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