Production testing of RF and system-on-a-chip devices for wireless communications /

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Schaub, Keith B.
Otros Autores: Kelly, Joe, Ph. D.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Norwood, MA : Artech House, ©2004.
Colección:Artech House microwave library.
Temas:
Systems on a chip > Testing.
Wireless communication systems > Equipment and supplies > Testing.
TECHNOLOGY & ENGINEERING > Telecommunications.
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Table of Contents vi; Preface xiii; Acknowledgments xvii; CHAPTER 1; An Introduction to Production Testing 1; CHAPTER 2; RF and SOC Devices 13; CHAPTER 3; Cost of Test 33; CHAPTER 4; Production Testing of RF Devices 49; CHAPTER 5; Production Testing of SOC Devices 95; CHAPTER 6; Fundamentals of Analog and Mixed-Signal Testing 145; CHAPTER 7; Moving Beyond Production Testing 175; CHAPTER 8; Production Noise Measurements 193; Appendix A: Power and Voltage Conversions 225; Appendix B: RF Coaxial Connectors 229; List of Acronyms and Abbreviations 233; List of Numerical Prefixes 237

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