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Survey automation : report and workshop proceedings /

For over 100 years, the evolution of modern survey methodology-using the theory of representative sampling to make interferences from a part of the population to the whole-has been paralleled by a drive toward automation, harnessing technology.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores Corporativos: Workshop on Survey Automation Washington, D.C., National Research Council (U.S.). Oversight Committee for the Workshop on Survey Automation, National Research Council (U.S.). Committee on National Statistics
Formato: Electrónico Congresos, conferencias eBook
Idioma:Inglés
Publicado: Washington, DC : National Academies Press, ©2003.
Temas:
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Current practice in documentation and testing
  • Shift from survey research to software engineering
  • Changing survey management processes to suit software design
  • Dealing with complexity: broadening the concept of documentation
  • Reducing insularity
  • Proceedings
  • Opening remarks
  • What makes the CAI testing and documentation problems so hard to solve? / Pat Doyle
  • Software engineering
  • the way to be / Jesse Poore
  • Automation and federal statistical surveys / Bob Groves
  • Understanding the documentation problem for complex Census Bureau computer assisted questionnaires / Thomas Piazza
  • The TADEQ project: documentation of electronic questionnaires / Jelke Bethlehem
  • Computer science approaches: visualization tools and software metrics / Thomas McCabe
  • Model-based testing in survey automation / Harry Robinson
  • Quality right from the start: the methodology of building testing into the product / Robert Smith
  • Interactive survey development: an integrated view / Lawrence Markosian
  • Practitioner needs and reactions to computer science approaches / Mark Pierzchala
  • Web-based data collection / Roger Tourangeau
  • Interface of survey methods with geographic information systems / Sarah Nusser
  • Prospects for survey data collection using pen-based computers / Jay Levinsohn and Martin Meyer
  • Panel discussion: how can computer science and survey methodology best interact in the future?