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On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond
The demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a cru...
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| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Aalborg :
River Publishers,
2019.
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| Temas: | |
| Acceso en línea: | Texto completo |
| Sumario: | The demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the modern IC design debug. This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guid. |
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| Notas: | Description based upon print version of record. |
| Descripción Física: | 1 online resource (278 p.) |
| ISBN: | 9788770221115 8770221111 |