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Understanding MEMS Principles and Applications.

Detalles Bibliográficos
Autor principal: Castañer, Luis
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Newark : John Wiley & Sons, Incorporated, 2015.
Colección:New York Academy of Sciences Ser.
Temas:
Acceso en línea:Texto completo

MARC

LEADER 00000cam a2200000Mu 4500
001 EBOOKCENTRAL_on1347025565
003 OCoLC
005 20240329122006.0
006 m o d
007 cr cnu||||||||
008 230209s2015 xx o ||| 0 eng d
040 |a EBLCP  |b eng  |c EBLCP  |d OCLCQ  |d EBLCP  |d OCLCQ  |d OCLCO  |d OCLCQ  |d OCLCL  |d OCLCQ 
020 |a 9781119055495 
020 |a 1119055490 
035 |a (OCoLC)1347025565 
082 0 4 |a 621.381  |q OCoLC  |2 23/eng/20230216 
049 |a UAMI 
100 1 |a Castañer, Luis. 
245 1 0 |a Understanding MEMS  |h [electronic resource] :  |b Principles and Applications. 
260 |a Newark :  |b John Wiley & Sons, Incorporated,  |c 2015. 
300 |a 1 online resource (401 p.). 
490 1 |a New York Academy of Sciences Ser. 
500 |a Description based upon print version of record. 
505 0 |a Intro -- Title page -- Copyright -- Dedication -- Preface -- About the Companion Website -- 1 Scaling of Forces -- 1.1 Scaling of Forces Model -- 1.2 Weight -- 1.3 Elastic Force -- 1.4 Electrostatic Force -- 1.5 Capillary Force -- 1.6 Piezoelectric Force -- 1.7 Magnetic Force -- 1.8 Dielectrophoretic Force -- 1.9 Summary -- Problems -- Notes -- 2 Elasticity -- 2.1 Stress -- 2.2 Strain -- 2.3 Stress-strain Relationship -- 2.4 Strain-stress Relationship in Anisotropic Materials -- 2.5 Miller Indices -- 2.6 Angles of Crystallographic Planes 
505 8 |a 2.7 Compliance and Stiffness Matrices for Single-Crystal Silicon -- 2.8 Orthogonal Transformation -- 2.9 Transformation of the Stress State -- 2.10 Orthogonal Transformation of the Stiffness Matrix -- 2.11 Elastic Properties of Selected MEMS Materials -- Problems -- 3 Bending of Microstructures -- 3.1 Static Equilibrium -- 3.2 Free Body Diagram -- 3.3 Neutral Plane and Curvature -- 3.4 Pure Bending -- 3.5 Moment of Inertia and Bending Moment -- 3.6 Beam Equation -- 3.7 End-loaded Cantilever -- 3.8 Equivalent Stiffness -- 3.9 Beam Equation for Point Load and Distributed Load 
505 8 |a 3.10 Castigliano's Second Theorem -- 3.11 Flexures -- 3.12 Rectangular Membrane -- 3.13 Simplified Model for a Rectangular Membrane Under Pressure -- 3.14 Edge-clamped Circular Membrane -- Problems -- 4 Piezoresistance and Piezoelectricity -- 4.1 Electrical Resistance -- 4.2 One-dimensional Piezoresistance Model -- 4.3 Piezoresistance in Anisotropic Materials -- 4.4 Orthogonal Transformation of Ohm's Law -- 4.5 Piezoresistance Coefficients Transformation -- 4.6 Two-dimensional Piezoresistors -- 4.7 Pressure Sensing with Rectangular Membranes -- 4.8 Piezoelectricity -- Problems -- Notes 
505 8 |a 5 Electrostatic Driving and Sensing -- 5.1 Energy and Co-energy -- 5.2 Voltage Drive -- 5.3 Pull-in Voltage -- 5.4 Electrostatic Pressure -- 5.5 Contact Resistance in Parallel-plate Switches -- 5.6 Hold-down Voltage -- 5.7 Dynamic Response of Pull-in-based Actuators -- 5.8 Charge Drive -- 5.9 Extending the Stable Range -- 5.10 Lateral Electrostatic Force -- 5.11 Comb Actuators -- 5.12 Capacitive Accelerometer -- 5.13 Differential Capacitive Sensing -- 5.14 Torsional Actuator -- Problems -- Notes -- 6 Resonators -- 6.1 Free Vibration: Lumped-element Model -- 6.2 Damped Vibration 
505 8 |a 6.3 Forced Vibration -- 6.4 Small Signal Equivalent Circuit of Resonators -- 6.5 Rayleigh-Ritz Method -- 6.6 Resonant Gyroscope -- 6.7 Tuning Fork Gyroscope -- Problems -- Notes -- 7 Microfluidics and Electrokinetics -- 7.1 Viscous Flow -- 7.2 Flow in a Cylindrical Pipe -- 7.3 Electrical Double Layer -- 7.4 Electro-osmotic Flow -- 7.5 Electrowetting -- 7.6 Electrowetting Dynamics -- 7.7 Dielectrophoresis -- Problems -- Notes -- 8 Thermal Devices -- 8.1 Steady-state Heat Equation -- 8.2 Thermal Resistance -- 8.3 Platinum Resistors -- 8.4 Flow Measurement Based on Thermal Sensors 
500 |a 8.5 Dynamic Thermal Equivalent Circuit 
590 |a ProQuest Ebook Central  |b Ebook Central Academic Complete 
655 0 |a Electronic books. 
758 |i has work:  |a Understanding MEMS (Text)  |1 https://id.oclc.org/worldcat/entity/E39PCFJ39hyXP8BtxgqTtFMGxP  |4 https://id.oclc.org/worldcat/ontology/hasWork 
776 0 8 |i Print version:  |a Castañer, Luis  |t Understanding MEMS  |d Newark : John Wiley & Sons, Incorporated,c2015  |z 9781119055426 
830 0 |a New York Academy of Sciences Ser. 
856 4 0 |u https://ebookcentral.uam.elogim.com/lib/uam-ebooks/detail.action?docID=7104387  |z Texto completo 
938 |a ProQuest Ebook Central  |b EBLB  |n EBL7104387 
994 |a 92  |b IZTAP