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On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Aalborg :
River Publishers,
2019.
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| Colección: | River Publishers Series in Electronic Materials and Devices Ser.
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| Temas: | |
| Acceso en línea: | Texto completo |
| Notas: | 5.5.3 Two-Step De-Embedding for Measurement of Load Reactance |
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| Descripción Física: | 1 online resource (278 pages) |
| ISBN: | 9788770221115 8770221111 |