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Engineering of submicron particles : fundamental concepts and models /

Brings together in one place the fundamental theory and models, and the practical aspects of submicron particle engineering This book attempts to resolve the tricky aspects of engineering submicron particles by discussing the fundamental theories of frequently used research tools-both theoretical an...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Chakraborty, Jayanta, 1976- (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Hoboken, NJ, USA : John Wiley & Sons, Inc., 2019.
Temas:
Acceso en línea:Texto completo

MARC

LEADER 00000cam a2200000 i 4500
001 EBOOKCENTRAL_on1098231017
003 OCoLC
005 20240329122006.0
006 m o d
007 cr |||||||||||
008 190416t20192019nju ob 001 0 eng
010 |a  2019018492 
040 |a DLC  |b eng  |e rda  |e pn  |c DLC  |d N$T  |d EBLCP  |d OCLCF  |d RECBK  |d DG1  |d YDX  |d UKAHL  |d OCLCQ  |d PUL  |d DG1  |d OCLCQ  |d DG1  |d OCLCO  |d K6U  |d OCLCQ  |d OCLCO  |d OCLCL 
019 |a 1104602721 
020 |a 9781119296454  |q (Adobe electronic book) 
020 |a 1119296455  |q (Adobe electronic book) 
020 |a 9781119296782  |q (electronic publication) 
020 |a 1119296781  |q (electronic publication) 
020 |a 9781119296447  |q (electronic book) 
020 |a 1119296447  |q (electronic book) 
020 |z 9781119296461  |q (hardcover) 
020 |z 1119296463 
029 1 |a AU@  |b 000065375648 
029 1 |a CHBIS  |b 011462581 
029 1 |a CHNEW  |b 001055843 
029 1 |a CHVBK  |b 568742494 
029 1 |a CHVBK  |b 570458307 
029 1 |a AU@  |b 000072392981 
035 |a (OCoLC)1098231017  |z (OCoLC)1104602721 
042 |a pcc 
050 4 |a TA418.78  |b .C475 2019 
072 7 |a TEC  |x 009000  |2 bisacsh 
072 7 |a TEC  |x 035000  |2 bisacsh 
082 0 0 |a 620.1/15  |2 23 
049 |a UAMI 
100 1 |a Chakraborty, Jayanta,  |d 1976-  |e author. 
245 1 0 |a Engineering of submicron particles :  |b fundamental concepts and models /  |c Jayanta Chakraborty, Department of Chemical Engineering, Indian Institute of Technology, Kharagpur, India. 
264 1 |a Hoboken, NJ, USA :  |b John Wiley & Sons, Inc.,  |c 2019. 
264 4 |c ©2019 
300 |a 1 online resource (205 pages) 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b n  |2 rdamedia 
338 |a online resource  |b nc  |2 rdacarrier 
504 |a Includes bibliographical references and index. 
505 0 |a Intro; Title Page; Copyright Page; Contents; Preface; About the Companion Website; Chapter 1 Nucleation; 1.1 Thermodynamics of Interfaces; 1.1.1 The Interface is a Surface of High Energy; 1.1.2 The Interface is a Surface Under Tension; 1.1.3 Pressure Drop Across Curved Interfaces; 1.1.3.1 Capillary Rise; 1.1.4 Vapour-Liquid Equilibrium Across Curved Interfaces; 1.1.4.1 Thomson Equation; 1.1.5 Stability of the Equilibrium; 1.2 Homogeneous Nucleation; 1.2.1 Energetics of Homogeneous Nucleation; 1.2.1.1 Energetics in Terms of Number of Units; 1.2.2 Kinetics of Homogeneous Nucleation 
505 8 |a 1.2.2.1 Concentration of Embryos/Nuclei1.2.2.2 Chain of Reactions Towards Formation of Nuclei; 1.2.2.3 Algebraic Manipulation of the Rate Expression; 1.2.2.4 Various Forms of Homogeneous Nucleation Rate; 1.2.3 Experimental Aspects of Homogeneous Nucleation; 1.2.3.1 Investigation Using a Cloud Chamber; 1.2.3.2 Other Methods; 1.3 Non-Homogeneous Nucleation; 1.3.1 Heterogeneous Nucleation; 1.3.2 Nucleating Agents and Organizers; 1.3.3 Secondary Nucleation; 1.4 Exercises; Bibliography; Chapter 2 Growth; 2.1 Traditional Crystal Growth Models; 2.1.1 Diffusion Controlled Growth 
505 8 |a 2.1.2 Surface Nucleation Controlled Growth2.1.2.1 Rate of Mononuclear Growth; 2.1.3 Surface Dislocation Controlled Growth: BCF Theory; 2.1.3.1 Rate of Surface Dislocation Controlled Growth; 2.2 Face Growth Theories; 2.2.1 Shape of a Crystal; 2.2.2 Laws of Face Growth; 2.2.2.1 Law of Bravais and Friedel; 2.2.3 Flat, Stepped, and Kinked Faces; 2.3 Measurement of Particle Size and Shape; 2.3.1 Optical Microscopy; 2.3.2 Electron Microscopy; 2.3.3 Light Scattering; 2.3.3.1 Rayleigh Scattering; 2.3.3.2 Static and Dynamic Light-Scattering Techniques; 2.4 Exercises; Bibliography 
505 8 |a Chapter 3 Inter-Particle Forces3.1 Inter-Molecular Forces; 3.1.1 Charge-Charge Interactions; 3.1.2 Charge-Dipole Interactions; 3.1.3 Dipole-Dipole Interactions; 3.1.4 Dipole-Induced Dipole Interactions; 3.1.5 Induced Dipole-Induced Dipole Interactions; 3.1.6 van der Waals Interaction; 3.1.7 Repulsive Potential and the Net Interaction Energy; 3.2 Inter-Particle Forces; 3.2.1 Hamaker's Pairwise Additivity Approach; 3.2.2 Lifshitz's Theory; 3.3 Measurement of Inter-Molecular Forces; 3.4 Measurement of Forces between Surfaces; 3.5 Exercises; Bibliography; Chapter 4 Stability; Charged Interface 
505 8 |a 4.1 Electrostatic Potential Near a Charged Surface4.2 Solution of the Poisson-Boltzmann Equation; 4.3 Repulsive Force between Two Surfaces; 4.4 Steric Stabilization; 4.5 Kinetics of Stability; 4.5.1 Diffusion of Colloidal Particles; 4.5.2 Particle Aggregation in the Absence of Potential; 4.5.3 Particle Aggregation in the Presence of a Net Potential; 4.6 Measurement of Surface Potential; 4.6.1 Surface Potential When Rs > −1; 4.7 Exercises; Bibliography; Chapter 5 Elementary Concepts of Number Balance; 5.1 State of a Particle 
520 |a Brings together in one place the fundamental theory and models, and the practical aspects of submicron particle engineering This book attempts to resolve the tricky aspects of engineering submicron particles by discussing the fundamental theories of frequently used research tools-both theoretical and experimental. The first part covers the Fundamental Models and includes sections on nucleation, growth, inter-molecular and inter-particle forces, colloidal stability, and kinetics. The second part examines the Modelling of a Suspension and features chapters on fundamental concepts of particulate systems, writing the number balance, modelling systems with particle breakage and aggregation, and Monte Carlo simulation. The book also offers plenty of diagrams, software, examples, brief experimental demonstrations, and exercises with answers. Engineering of Submicron Particles: Fundamental Concepts and Models offers a lengthy discussion of classical nucleation theory, and introduces other nucleation mechanisms like organizer mechanisms. It also looks at older growth models like diffusion controlled or surface nucleation controlled growth, along with new generation models like connected net analysis. Aggregation models and inter-particle potentials are touched upon in a prelude on intermolecular and surface forces. The book also provides analytical and numerical solutions of population balance models so readers can solve basic population balance equations independently.-Presents the fundamental theory, practical aspects, and models of submicron particle engineering -Teaches readers to write number balances for their own system of interest -Provides software with open code for solution of population balance model through discretization -Filled with diagrams, examples, demonstrations, and exercises Engineering of Submicron Particles: Fundamental Concepts and Models will appeal to researchers in chemical engineering, physics, chemistry, engineering, and mathematics concerned with particulate systems. It is also a good text for advanced students taking particle technology courses. 
588 0 |a Online resource; title from digital title page (viewed on August 27, 2019). 
590 |a ProQuest Ebook Central  |b Ebook Central Academic Complete 
650 0 |a Nanoparticles. 
650 2 |a Nanoparticles 
650 6 |a Nanoparticules. 
650 7 |a TECHNOLOGY & ENGINEERING  |x Engineering (General)  |2 bisacsh 
650 7 |a TECHNOLOGY & ENGINEERING  |x Reference.  |2 bisacsh 
650 7 |a Nanoparticles  |2 fast 
758 |i has work:  |a Engineering of submicron particles (Text)  |1 https://id.oclc.org/worldcat/entity/E39PCG79XvvV8Rxm9p3YX7Bmv3  |4 https://id.oclc.org/worldcat/ontology/hasWork 
776 0 8 |i Print version:  |a Chakraborty, Jayanta, 1976-  |t Engineering of submicron particles.  |d Hoboken, NJ, USA : John Wiley & Sons, Inc., [2019]  |z 9781119296461  |w (DLC) 2019015637 
856 4 0 |u https://ebookcentral.uam.elogim.com/lib/uam-ebooks/detail.action?docID=5787870  |z Texto completo 
938 |a Askews and Holts Library Services  |b ASKH  |n AH36138318 
938 |a ProQuest Ebook Central  |b EBLB  |n EBL5787870 
938 |a EBSCOhost  |b EBSC  |n 2160118 
938 |a Recorded Books, LLC  |b RECE  |n rbeEB00761221 
938 |a YBP Library Services  |b YANK  |n 16280504 
994 |a 92  |b IZTAP