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Conductive Atomic Force Microscope.

Detalles Bibliográficos
Clasificación:	Libro Electrónico
Autor principal:	Lanza, Mario
Formato:	Electrónico eBook
Idioma:	Inglés
Publicado:	Newark : John Wiley & Sons, Incorporated, 2017.
Temas:	Atomic force microscopy. Microscopie à force atomique. Atomic force microscopy
Acceso en línea:	Texto completo

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