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Swift ion beam analysis in nanosciences /
Swift ion beam analysis (IBA) of materials and their surfaces has been widely applied to many fields over the last half century, constantly evolving to meet new requirements and to take advantage of developments in particle detection and data treatment. Today, emerging fields in nanosciences introdu...
| Clasificación: | Libro Electrónico |
|---|---|
| Autores principales: | , , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
London, UK : Hoboken, NJ :
ISTE, Ltd. ; Wiley,
2017.
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| Colección: | RSC nanoscience & nanotechnology.
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| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Introduction
- Fundamentals of ion-solid interactions with a focus on the nanoscale ; General considerations ; Basic physical concepts ; Channeling, shadowing and blocking ; 1D layers : limits to depth resolution ; 2D and 3D objects : aspects of lateral resolution
- Instruments and methods ; Instruments ; Methods
- Applications ; Example of resonances/light element profiling ; Quantitative analysis/heavy element profiling ; Examples of HR-ERD analysis ; Channeling/defect profiling ; Blocking/strain profiling ; 3D MEIS/real space structural analysis
- The place of nanoIBA in the characterization forest ; Introduction ; Scope of physical and chemical characterization ; Ion-based characterization techniques overview ; Ion-mass-spectroscopy-based characterization techniques versus IBA ; Other characterization techniques versus IBA ; Emerging ion-beam-based techniques.