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Swift ion beam analysis in nanosciences /

Swift ion beam analysis (IBA) of materials and their surfaces has been widely applied to many fields over the last half century, constantly evolving to meet new requirements and to take advantage of developments in particle detection and data treatment. Today, emerging fields in nanosciences introdu...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Jalabert, Denis (Autor), Vickridge, Ian, 1958- (Autor), Chabli, Amal (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: London, UK : Hoboken, NJ : ISTE, Ltd. ; Wiley, 2017.
Colección:RSC nanoscience & nanotechnology.
Temas:
Acceso en línea:Texto completo