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OLED display fundamentals and applications /

"This book covers the aspects necessary to the design and manufacturing of OLED displays. Topics include emission mechanism, material selection, device processing, manufacturing issues and countermeasures and display design basics. In addition, the book defines elements of OLED such as Thin Fil...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Tsujimura, Takatoshi
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Hoboken, New Jersey : John Wiley & Sons Inc., 2017.
Edición:Second edition.
Temas:
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Cover; Title Page; Copyright; Contents; About the Author; Preface; Series Editor's Foreword to the Second Edition; Chapter 1 Introduction; References; Chapter 2 OLED Devices; 2.1 OLED Definition; 2.1.1 History of OLED Research and Development; 2.1.2 Luminescent Effects in Nature; 2.1.3 Difference Between OLED, LED, and Inorganic ELs; 2.1.3.1 Inorganic EL; 2.1.3.2 LED; 2.2 Basic Device Structure; 2.3 Basic Light Emission Mechanism; 2.3.1 Potential Energy of Molecules; 2.3.2 Highest Occupied and Lowest Unoccupied Molecular Orbitals (HOMO and LUMO); 2.3.3 Configuration of Two Electrons.
  • 2.3.4 Spin Function; 2.3.5 Singlet and Triplet Excitons; 2.3.6 Charge Injection from Electrodes; 2.3.6.1 Charge Injection by Schottky Thermionic Emission; 2.3.6.2 Tunneling Injection; 2.3.6.3 Vacuum-Level Shift; 2.3.7 Charge Transfer and Recombination; 2.3.7.1 Charge Transfer Behavior; 2.3.7.2 Space-Charge-Limited Current; 2.3.7.3 Poole-Frenkel conduction; 2.3.7.4 Recombination and Generation of Excitons; 2.4 Emission Efficiency; 2.4.1 Internal/External Quantum Efficiency; 2.4.2 Energy Conversion and Quenching; 2.4.2.1 Internal Conversion; 2.4.2.2 Intersystem Crossing; 2.4.2.3 Doping.
  • 2.4.2.4 Quenching; 2.4.3 Outcoupling Efficiency of OLED Display; 2.4.3.1 Light Output Distribution; 2.4.3.2 Snell's Law and Critical Angle; 2.4.3.3 Loss Due to Light Extraction; 2.4.3.4 Performance Enhancement by Molecular Alignment; 2.5 Lifetime and Image Burning; 2.5.1 Lifetime Definitions; 2.5.2 Degradation Analysis and Design Optimization; 2.5.3 Degradation Measurement and Mechanisms; 2.5.3.1 Acceleration Factor and Temperature Contribution; 2.5.3.2 Degradation Mechanism Variation; 2.6 Technologies to Enhance the Device Performance; 2.6.1 Thermally Activated Delayed Fluorescence.
  • 2.6.2 Other Types of Excited States; 2.6.2.1 Excimer and Exciplex; 2.6.2.2 Charge-Transfer Complex; 2.6.3 Charge Generation Layer; References; Chapter 3 OLED Manufacturing Process; 3.1 Material Preparation; 3.1.1 Basic Material Properties; 3.1.1.1 Hole Injection Material; 3.1.1.2 Hole Transportation Material; 3.1.1.3 Emission Layer Material; 3.1.1.4 Electron Transportation Material and Charge Blocking Material; 3.1.2 Purification Process; 3.2 Evaporation Process; 3.2.1 Principle; 3.2.2 Evaporation Sources; 3.2.2.1 Resistive Heating Method; 3.2.2.2 Electron Beam Evaporation.
  • 3.2.2.3 Monitoring Thickness Using a Quartz Oscillator; 3.3 Encapsulation; 3.3.1 Dark Spot and Edge Growth Defects; 3.3.2 Light Emission from the Bottom and Top of the OLED Device; 3.3.3 Bottom Emission and perimeter sealing; 3.3.4 Top Emission; 3.3.5 Encapsulation Technologies and Measurement; 3.3.5.1 Thin-Film Encapsulation; 3.3.5.2 Face Sealing Encapsulation; 3.3.5.3 Frit Encapsulation; 3.3.5.4 WVTR Measurement; 3.4 Problem Analysis; 3.4.1 Ionization Potential Measurement; 3.4.2 Electron Affinity Measurement; 3.4.3 HPLC Analysis; 3.4.4 Cyclic Voltammetry; References.