Cargando…

Nano devices and sensors /

"The chapters in this edited book are written by some authors who have presented very high quality papers at the 2015 International Symposium of Next-Generation Electronics (ISNE 2015) held in Taipei, Taiwan. The ISNE 2015 was intended to provide a common forum for researchers, scientists, engi...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: International Symposium on Next-Generation Electronics Taipei, Taiwan
Otros Autores: Liou, Juin J. (Editor ), Liaw, Shien-Kuei (Editor ), Chung, Yung-Hui (Editor )
Formato: Electrónico Congresos, conferencias eBook
Idioma:Inglés
Publicado: Boston ; Berlin : De Gruyter, [2016]
Temas:
Acceso en línea:Texto completo

MARC

LEADER 00000cam a2200000 i 4500
001 EBOOKCENTRAL_ocn948780477
003 OCoLC
005 20240329122006.0
006 m o d
007 cr |n|||||||||
008 160506t20162016maua ob 100 0 eng d
040 |a IDEBK  |b eng  |e rda  |e pn  |c IDEBK  |d YDXCP  |d OCLCO  |d CN3GA  |d EBLCP  |d COO  |d OCLCF  |d N$T  |d YDX  |d KNOVL  |d MYG  |d DEBSZ  |d STF  |d OCLCQ  |d CCO  |d WAU  |d COCUF  |d LOA  |d MERUC  |d K6U  |d AGLDB  |d ICA  |d PIFAG  |d FVL  |d NRC  |d OCLCQ  |d OCLCO  |d DEGRU  |d ZCU  |d U3W  |d D6H  |d WRM  |d OCLCQ  |d VTS  |d ICG  |d OTZ  |d VT2  |d AU@  |d WYU  |d OCLCQ  |d TKN  |d LEAUB  |d AUW  |d BTN  |d INTCL  |d MHW  |d SNK  |d OCLCO  |d DKC  |d OCLCQ  |d OCLCO  |d OCLCQ  |d AJS  |d OCLCO  |d OCLCQ  |d OCLCO  |d OCLCL 
066 |c (S 
019 |a 949883233  |a 958448369  |a 1162387446  |a 1228567447 
020 |a 9781501501531  |q (pdf) 
020 |a 1501501534  |q (pdf) 
020 |a 9781501501555  |q (epub) 
020 |a 1501501550  |q (epub) 
020 |a 9781523104611  |q (electronic book) 
020 |a 1523104619  |q (electronic book) 
020 |a 9781501501548  |q (print + online) 
020 |a 1501501542  |q (print + online) 
020 |z 9781501510502  |q (cloth) 
020 |z 1501510509  |q (cloth) 
024 7 |a 10.1515/9781501501531  |2 doi 
029 1 |a AU@  |b 000058034654 
029 1 |a DEBSZ  |b 48036866X 
029 1 |a DEBSZ  |b 489855822 
035 |a (OCoLC)948780477  |z (OCoLC)949883233  |z (OCoLC)958448369  |z (OCoLC)1162387446  |z (OCoLC)1228567447 
037 |a 919692  |b MIL 
050 4 |a TK7874.84  |b .I578 2015 
072 7 |a TEC  |x 009000  |2 bisacsh 
072 7 |a TEC  |x 035000  |2 bisacsh 
082 0 4 |a 620.5  |2 23 
049 |a UAMI 
111 2 |a International Symposium on Next-Generation Electronics  |n (4th :  |d 2015 :  |c Taipei, Taiwan) 
245 1 0 |a Nano devices and sensors /  |c edited by Juin J. Liou, Shien-Kuei Liaw, Yung-Hui Chung. 
264 1 |a Boston ;  |a Berlin :  |b De Gruyter,  |c [2016] 
264 4 |c ©2016 
300 |a 1 online resource (220 pages) :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |b PDF 
347 |a text file 
500 |a Selection of papers from 2015 International Symposium of Next-Generation Electronics (ISNE 2015) held in Taipei, Taiwan. 
504 |a Includes bibliographical references. 
520 |a "The chapters in this edited book are written by some authors who have presented very high quality papers at the 2015 International Symposium of Next-Generation Electronics (ISNE 2015) held in Taipei, Taiwan. The ISNE 2015 was intended to provide a common forum for researchers, scientists, engineers, and practitioners throughout the world to present their latest research findings, ideas, developments, and applications in the general areas of electron devices, integrated circuits, and microelectronic systems and technologies"--Provided by publisher 
588 0 |a Print version record. 
546 |a In English. 
505 0 |a Subthreshold Behaviors of Nanoscale Silicon and Germanium Junctionless Cylindrical Surrounding-Gate MOSFETs -- Silicon-on-Insulator for Spintronic Applications: Spin Lifetime and Electric Spin Manipulation -- Multilevel Cell Storage and Resistance Variability in Resistive Random Access Memory -- Resistive Switching Characteristics and Mechanisms in Silicon Oxide Memory Devices -- A Synaptic Device Built in One Diode-One Resistor (1D-1R) Architecture with Intrinsic SiOx-Based Resistive Switching Memory -- On-chip Wide Range Bidirectional Current Sensor for Li-ion Battery Management System -- A 12-bit 1-MS/s 26-æW SAR ADC for Sensor Applications -- A 5.2/5.8 GHz Dual Band On-Off Keying Transmitter Design for Bio-Signal Transmission -- Impacts of ESD Reliability by Different Layout Engineering in the 0.25-æm 60-V High-Voltage LDMOS Devices -- Impact-Based Area Allocation for Yield Optimization in Integrated Circuits -- Editors -- List of authors. 
590 |a ProQuest Ebook Central  |b Ebook Central Academic Complete 
590 |a Knovel  |b ACADEMIC - Nanotechnology 
590 |a eBooks on EBSCOhost  |b EBSCO eBook Subscription Academic Collection - Worldwide 
650 0 |a Nanoelectronics  |v Congresses. 
650 6 |a Nanoélectronique  |v Congrès. 
650 7 |a TECHNOLOGY & ENGINEERING  |x Engineering (General)  |2 bisacsh 
650 7 |a TECHNOLOGY & ENGINEERING  |x Reference.  |2 bisacsh 
650 7 |a Nanoelectronics  |2 fast 
655 7 |a proceedings (reports)  |2 aat 
655 7 |a Conference papers and proceedings  |2 fast 
655 7 |a Conference papers and proceedings.  |2 lcgft 
655 7 |a Actes de congrès.  |2 rvmgf 
700 1 |a Liou, Juin J.,  |e editor. 
700 1 |a Liaw, Shien-Kuei,  |e editor. 
700 1 |a Chung, Yung-Hui,  |e editor. 
758 |i has work:  |a Nano devices and sensors (Text)  |1 https://id.oclc.org/worldcat/entity/E39PCFPJqTC77MWhWdbhGP98kC  |4 https://id.oclc.org/worldcat/ontology/hasWork 
776 0 8 |i Print version:  |a International Symposium on Next-Generation Electronics (4th : 2015 : Taipei, Taiwan).  |t Nano devices and sensors.  |d Berlin ; Boston : De Gruyter, [2016]  |z 9781501510502  |w (DLC) 2016016432  |w (OCoLC)948968348 
856 4 0 |u https://ebookcentral.uam.elogim.com/lib/uam-ebooks/detail.action?docID=4517741  |z Texto completo 
880 0 |6 505-00/(S  |a Subthreshold Behaviors of Nanoscale Silicon and Germanium Junctionless Cylindrical Surrounding-Gate MOSFETs -- Silicon-on-Insulator for Spintronic Applications: Spin Lifetime and Electric Spin Manipulation -- Multilevel Cell Storage and Resistance Variability in Resistive Random Access Memory -- Resistive Switching Characteristics and Mechanisms in Silicon Oxide Memory Devices -- A Synaptic Device Built in One Diode-One Resistor (1D-1R) Architecture with Intrinsic SiOx-Based Resistive Switching Memory -- On-chip Wide Range Bidirectional Current Sensor for Li-ion Battery Management System -- A 12-bit 1-MS/s 26-μW SAR ADC for Sensor Applications -- A 5.2/5.8 GHz Dual Band On-Off Keying Transmitter Design for Bio-Signal Transmission -- Impacts of ESD Reliability by Different Layout Engineering in the 0.25-μm 60-V High-Voltage LDMOS Devices -- Impact-Based Area Allocation for Yield Optimization in Integrated Circuits. 
938 |a YBP Library Services  |b YANK  |n 12039095 
938 |a YBP Library Services  |b YANK  |n 12039094 
938 |a ProQuest MyiLibrary Digital eBook Collection  |b IDEB  |n cis30030182 
938 |a EBSCOhost  |b EBSC  |n 1246429 
938 |a EBL - Ebook Library  |b EBLB  |n EBL4517741 
938 |a De Gruyter  |b DEGR  |n 9781501501531 
994 |a 92  |b IZTAP