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ISTFA 2015 : conference proceedings from the 41st International Symposium for Testing and Failure Analysis, November 1-5, 2015, Oregon Convention Center, Portland, Oregon, USA /
Annotation
| Clasificación: | Libro Electrónico |
|---|---|
| Autor Corporativo: | |
| Formato: | Electrónico Congresos, conferencias eBook |
| Idioma: | Inglés |
| Publicado: |
Materials Park, Ohio :
ASM International,
[2015]
|
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
| LEADER | 00000cam a2200000Mi 4500 | ||
|---|---|---|---|
| 001 | EBOOKCENTRAL_ocn944175695 | ||
| 003 | OCoLC | ||
| 005 | 20240329122006.0 | ||
| 006 | m o d | ||
| 007 | cr |n||||||||| | ||
| 008 | 160304s2015 ohu o 100 0 eng d | ||
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| 019 | |a 940934393 |a 950980466 | ||
| 020 | |a 9781627081030 |q (electronic bk.) | ||
| 020 | |a 1627081038 |q (electronic bk.) | ||
| 020 | |a 9781523102068 |q (electronic bk.) | ||
| 020 | |a 1523102063 |q (electronic bk.) | ||
| 020 | |z 162708102X | ||
| 020 | |z 9781627081023 | ||
| 029 | 1 | |a AU@ |b 000057279812 | |
| 029 | 1 | |a DEBBG |b BV044059993 | |
| 029 | 1 | |a GBVCP |b 870366742 | |
| 035 | |a (OCoLC)944175695 |z (OCoLC)940934393 |z (OCoLC)950980466 | ||
| 050 | 4 | |a TK7871 |b .I58 2015 | |
| 082 | 0 | 4 | |a 621.381 |2 23 |
| 049 | |a UAMI | ||
| 111 | 2 | |a International Symposium for Testing and Failure Analysis |n (41st : |d 2015 : |c Portland, Or.), |j issuing body. | |
| 245 | 1 | 0 | |a ISTFA 2015 : |b conference proceedings from the 41st International Symposium for Testing and Failure Analysis, November 1-5, 2015, Oregon Convention Center, Portland, Oregon, USA / |c organized by the Electronic Device Failure Analysis Society. |
| 264 | 1 | |a Materials Park, Ohio : |b ASM International, |c [2015] | |
| 300 | |a 1 online resource | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 588 | 0 | |a Online resource; title from digital title page (viewed on March 04, 2016). | |
| 520 | 8 | |a Annotation |b This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, 'Follow the Data'. | |
| 590 | |a Knovel |b ACADEMIC - Mechanics & Mechanical Engineering | ||
| 590 | |a Knovel |b ACADEMIC - Nondestructive Testing & Evaluation | ||
| 590 | |a ProQuest Ebook Central |b Ebook Central Academic Complete | ||
| 650 | 0 | |a Electronics |x Materials |x Testing |v Congresses. | |
| 650 | 0 | |a Electronic apparatus and appliances |x Testing |v Congresses. | |
| 650 | 6 | |a Appareils électroniques |x Essais |v Congrès. | |
| 650 | 7 | |a Electronic apparatus and appliances |x Testing |2 fast | |
| 650 | 7 | |a Electronics |x Materials |x Testing |2 fast | |
| 655 | 7 | |a Conference papers and proceedings |2 fast | |
| 776 | 0 | 8 | |i Print version: |a Asm International. |t Istfa 2015 proceedings from the 41st international symposium for testing and failure analysis. |d [Place of publication not identified] : A S M International, 2015 |z 162708102X |z 9781627081023 |w (OCoLC)930486191 |
| 856 | 4 | 0 | |u https://ebookcentral.uam.elogim.com/lib/uam-ebooks/detail.action?docID=4392496 |z Texto completo |
| 938 | |a EBL - Ebook Library |b EBLB |n EBL4392496 | ||
| 938 | |a YBP Library Services |b YANK |n 12858404 | ||
| 994 | |a 92 |b IZTAP | ||