Next generation HALT and HASS : robust design of electronics and systems /

Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics-of-failure-base...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Gray, Kirk (Autor), Paschkewitz, John James (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Chichester, UK ; Hoboken, NJ : John Wiley & Sons, 2016.
Temas:
Accelerated life testing.
Electronic systems > Design and construction.
Electronic systems > Testing.
Essais accélérés (Technologie)
accelerated aging.
TECHNOLOGY & ENGINEERING > Mechanical.
Accelerated life testing
Electronic systems > Design and construction
Electronic systems > Testing
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Basis and limitations of typical current reliability methods & metrics
  • The need for reliability assurance metrics to change
  • Challenges to advancing electronics reliability engineering
  • A new deterministic reliability development paradigm
  • Common understanding of HALT approach is critical for success
  • The fundamentals of HALT
  • Highly accelerated stress screening (HALT) and audits (HASA)
  • HALT benefits for software/firmware performance and reliability
  • Quantitative accelerated life test
  • Failure analysis and corrective action
  • Additional applications of HALT methods.

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