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Next generation HALT and HASS : robust design of electronics and systems /
Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics-of-failure-base...
| Clasificación: | Libro Electrónico |
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| Autores principales: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Chichester, UK ; Hoboken, NJ :
John Wiley & Sons,
2016.
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| Temas: | |
| Acceso en línea: | Texto completo |