Cargando…
Next generation HALT and HASS : robust design of electronics and systems /
Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics-of-failure-base...
| Clasificación: | Libro Electrónico |
|---|---|
| Autores principales: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Chichester, UK ; Hoboken, NJ :
John Wiley & Sons,
2016.
|
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
| LEADER | 00000cam a2200000 i 4500 | ||
|---|---|---|---|
| 001 | EBOOKCENTRAL_ocn933211556 | ||
| 003 | OCoLC | ||
| 005 | 20240329122006.0 | ||
| 006 | m o d | ||
| 007 | cr ||||||||||| | ||
| 008 | 151217s2016 enk ob 001 0 eng | ||
| 010 | |a 2015049975 | ||
| 040 | |a DLC |b eng |e rda |e pn |c DLC |d OCLCF |d EBLCP |d N$T |d DG1 |d UIU |d IDEBK |d CDX |d YDXCP |d COO |d DEBBG |d KSU |d DEBSZ |d YDX |d RECBK |d CCO |d IDB |d MERUC |d LOA |d DG1 |d K6U |d STF |d OCLCQ |d COCUF |d OCLCQ |d LIP |d PIFAG |d FVL |d OCLCQ |d CHVBK |d ZCU |d U3W |d OCLCQ |d WRM |d OCLCQ |d ICG |d VT2 |d UKMGB |d OCLCQ |d WYU |d TKN |d OCLCQ |d DKC |d OCLCQ |d OCLCO |d OCLCQ |d OCLCO |d OCLCL | ||
| 016 | 7 | |a 017775679 |2 Uk | |
| 019 | |a 951602450 |a 965469983 |a 992824022 | ||
| 020 | |a 9781118700204 |q (Adobe PDF) | ||
| 020 | |a 1118700201 |q (Adobe PDF) | ||
| 020 | |a 9781118700211 |q (ePub) | ||
| 020 | |a 111870021X |q (ePub) | ||
| 020 | |a 9781118700228 | ||
| 020 | |a 1118700228 | ||
| 020 | |a 1118700236 |q (cloth) | ||
| 020 | |a 9781118700235 |q (cloth) | ||
| 020 | |z 9781118700235 |q (cloth) | ||
| 029 | 1 | |a AU@ |b 000060219692 | |
| 029 | 1 | |a CHBIS |b 010661926 | |
| 029 | 1 | |a CHNEW |b 000945034 | |
| 029 | 1 | |a CHVBK |b 480252726 | |
| 029 | 1 | |a DEBBG |b BV043738222 | |
| 029 | 1 | |a DEBBG |b BV044060784 | |
| 029 | 1 | |a DEBSZ |b 480372284 | |
| 029 | 1 | |a DEBSZ |b 485064359 | |
| 029 | 1 | |a UKMGB |b 017775679 | |
| 035 | |a (OCoLC)933211556 |z (OCoLC)951602450 |z (OCoLC)965469983 |z (OCoLC)992824022 | ||
| 037 | |a 9781118700211 |b Wiley | ||
| 042 | |a pcc | ||
| 050 | 0 | 0 | |a TA169.3 |
| 072 | 7 | |a TEC |x 009070 |2 bisacsh | |
| 082 | 0 | 0 | |a 621.381028/7 |2 23 |
| 049 | |a UAMI | ||
| 100 | 1 | |a Gray, Kirk, |e author. | |
| 245 | 1 | 0 | |a Next generation HALT and HASS : |b robust design of electronics and systems / |c by Kirk Gray, John James Paschkewitz. |
| 264 | 1 | |a Chichester, UK ; |a Hoboken, NJ : |b John Wiley & Sons, |c 2016. | |
| 300 | |a 1 online resource | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | |a Basis and limitations of typical current reliability methods & metrics -- The need for reliability assurance metrics to change -- Challenges to advancing electronics reliability engineering -- A new deterministic reliability development paradigm -- Common understanding of HALT approach is critical for success -- The fundamentals of HALT -- Highly accelerated stress screening (HALT) and audits (HASA) -- HALT benefits for software/firmware performance and reliability -- Quantitative accelerated life test -- Failure analysis and corrective action -- Additional applications of HALT methods. | |
| 588 | 0 | |a Print version record and CIP data provided by publisher. | |
| 520 | |a Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics-of-failure-based robust product and process development methodology. The new methodologies challenge misleading and sometimes costly mis-application of probabilistic failure prediction methods (FPM) and provide a new deterministic map for reliability development. The authors clearly explain the new approach with a logical progression of problem statement and solutions. The book helps engineers employ HALT and HASS by illustrating why the misleading assumptions used for FPM are invalid. Next, the application of HALT and HASS empirical discovery methods to quickly find unreliable elements in electronics systems gives readers practical insight to the techniques. The physics of HALT and HASS methodologies are highlighted, illustrating how they uncover and isolate software failures due to hardware-software interactions in digital systems. The use of empirical operational stress limits for the development of future tools and reliability discriminators is described. Key features: * Provides a clear basis for moving from statistical reliability prediction models to practical methods of insuring and improving reliability. * Challenges existing failure prediction methodologies by highlighting their limitations using real field data. * Explains a practical approach to why and how HALT and HASS are applied to electronics and electromechanical systems. * Presents opportunities to develop reliability test discriminators for prognostics using empirical stress limits. * Guides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS. * Integrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development process. | ||
| 590 | |a ProQuest Ebook Central |b Ebook Central Academic Complete | ||
| 650 | 0 | |a Accelerated life testing. | |
| 650 | 0 | |a Electronic systems |x Design and construction. | |
| 650 | 0 | |a Electronic systems |x Testing. | |
| 650 | 6 | |a Essais accélérés (Technologie) | |
| 650 | 7 | |a accelerated aging. |2 aat | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Mechanical. |2 bisacsh | |
| 650 | 7 | |a Accelerated life testing |2 fast | |
| 650 | 7 | |a Electronic systems |x Design and construction |2 fast | |
| 650 | 7 | |a Electronic systems |x Testing |2 fast | |
| 700 | 1 | |a Paschkewitz, John James, |e author. | |
| 758 | |i has work: |a Next generation HALT and HASS (Text) |1 https://id.oclc.org/worldcat/entity/E39PCGHc3vmWkGktkJQcdpXxtC |4 https://id.oclc.org/worldcat/ontology/hasWork | ||
| 776 | 0 | 8 | |i Print version: |a Gray, Kirk. |t Next generation HALT and HASS. |d Chichester, UK ; Hoboken, NJ : John Wiley & Sons, 2016 |z 9781118700235 |w (DLC) 2015044935 |
| 856 | 4 | 0 | |u https://ebookcentral.uam.elogim.com/lib/uam-ebooks/detail.action?docID=4451897 |z Texto completo |
| 938 | |a Coutts Information Services |b COUT |n 27576507 | ||
| 938 | |a EBL - Ebook Library |b EBLB |n EBL4451897 | ||
| 938 | |a EBSCOhost |b EBSC |n 1202074 | ||
| 938 | |a ProQuest MyiLibrary Digital eBook Collection |b IDEB |n cis27576507 | ||
| 938 | |a Recorded Books, LLC |b RECE |n rbeEB00666516 | ||
| 938 | |a YBP Library Services |b YANK |n 12888466 | ||
| 994 | |a 92 |b IZTAP | ||