Electrical overstress (EOS) : devices, circuits, and systems /
"Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a...
Clasificación: | Libro Electrónico |
---|---|
Autor principal: | Voldman, Steven H. |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Chichester, West Sussex, United Kingdom :
John Wiley & Sons Inc.,
2014.
|
Colección: | ESD series.
|
Temas: | |
Acceso en línea: | Texto completo |
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