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Visual Inspection Technology in the Hard Disc Drive Industry.

A presentation of the use of computer vision systems to control manufacturing processes and product quality in the hard disk drive industry. Visual Inspection Technology in the Hard Disk Drive Industry is an<br /> application-oriented book borne out of collaborative research with the world...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Muneesawang, Paisarn
Otros Autores: Yammen, Suchart
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Hoboken : Wiley, 2015.
Colección:Computer engineering series (London, England)
Temas:
Acceso en línea:Texto completo

MARC

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082 0 4 |a 629.8323 
049 |a UAMI 
100 1 |a Muneesawang, Paisarn. 
245 1 0 |a Visual Inspection Technology in the Hard Disc Drive Industry. 
260 |a Hoboken :  |b Wiley,  |c 2015. 
300 |a 1 online resource (320 pages) 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a Computer engineering series 
588 0 |a Print version record. 
500 |a 6: Artificial Intelligence Techniques for Quality Control of Hard Disk Drive Components. 
520 |a A presentation of the use of computer vision systems to control manufacturing processes and product quality in the hard disk drive industry. Visual Inspection Technology in the Hard Disk Drive Industry is an<br /> application-oriented book borne out of collaborative research with the world's leading hard disk drive companies. It covers the latest developments and important topics in computer vision technology in hard disk drive manufacturing, as well as offering a glimpse of future technologies. 
504 |a Includes bibliographical references and index. 
505 0 |a Machine generated contents note: 1.1. Introduction / Suchart Yammen / Paisarn Muneesawang -- 1.2. Algorithm for corrosion detection / Suchart Yammen / Paisarn Muneesawang -- 1.2.1. Extraction of top-shield region / Suchart Yammen / Paisarn Muneesawang -- 1.2.2. Area-based feature / Suchart Yammen / Paisarn Muneesawang -- 1.2.3. Contour-based feature / Suchart Yammen / Paisarn Muneesawang -- 1.3. Experimental result / Suchart Yammen / Paisarn Muneesawang -- 1.3.1. Distribution of corrosion / Suchart Yammen / Paisarn Muneesawang -- 1.3.2. Performance metric / Suchart Yammen / Paisarn Muneesawang -- 1.3.3. Robustness / Suchart Yammen / Paisarn Muneesawang -- 1.4. Conclusion / Suchart Yammen / Paisarn Muneesawang -- 1.5. Bibliography / Suchart Yammen / Paisarn Muneesawang -- 2.1. Introduction / Paisarn Muneesawang / Suchart Yammen -- 2.2. Perpendicular magnetic recording / Paisarn Muneesawang / Suchart Yammen. 
505 0 |a Note continued: 2.3. Perpendicular magnetic recorder and corrosion / Paisarn Muneesawang / Suchart Yammen -- 2.3.1. Lubricant layer / Paisarn Muneesawang / Suchart Yammen -- 2.3.2. Thermal effect results in corrosion / Paisarn Muneesawang / Suchart Yammen -- 2.3.3. Recording head/slider manufacturing and corrosion / Paisarn Muneesawang / Suchart Yammen -- 2.4. Length estimator for pole tip / Paisarn Muneesawang / Suchart Yammen -- 2.5. Nonlinear filtering as a corrosion detector / Paisarn Muneesawang / Suchart Yammen -- 2.5.1. Median filter techniques / Paisarn Muneesawang / Suchart Yammen -- 2.5.2. Median s-Filter / Paisarn Muneesawang / Suchart Yammen -- 2.5.3. Corrosion detection procedure / Paisarn Muneesawang / Suchart Yammen -- 2.6. Application / Paisarn Muneesawang / Suchart Yammen -- 2.7. Conclusion / Paisarn Muneesawang / Suchart Yammen -- 2.8. Bibliography / Paisarn Muneesawang / Suchart Yammen -- 3.1. Introduction / Pichate Kunakornvong / Pitikhate Sooraksa. 
505 0 |a Note continued: 3.2. Air-bearing surface / Pichate Kunakornvong / Pitikhate Sooraksa -- 3.3. Imaging system / Pichate Kunakornvong / Pitikhate Sooraksa -- 3.4. Contamination detection / Pichate Kunakornvong / Pitikhate Sooraksa -- 3.4.1. Texture unit texture spectrum / Pichate Kunakornvong / Pitikhate Sooraksa -- 3.4.2. Graylevel co-occurrence matrix / Pichate Kunakornvong / Pitikhate Sooraksa -- 3.4.3. Principle component analysis / Pichate Kunakornvong / Pitikhate Sooraksa -- 3.4.4. Identification defect / Pichate Kunakornvong / Pitikhate Sooraksa -- 3.5. Conclusion / Pichate Kunakornvong / Pitikhate Sooraksa -- 3.6. Acknowledgment / Pichate Kunakornvong / Pitikhate Sooraksa -- 3.7. Bibliography / Pichate Kunakornvong / Pitikhate Sooraksa -- 4.1. Introduction / Jirarat Ieamsaard / Thanapoom Fuangpian -- 4.2. Head gimbal assembly / Jirarat Ieamsaard / Thanapoom Fuangpian -- 4.3. Vertical edge method for inspection of pad burning defect / Jirarat Ieamsaard / Thanapoom Fuangpian. 
505 0 |a Note continued: 4.3.1. Inspection procedure / Jirarat Ieamsaard / Thanapoom Fuangpian -- 4.3.2. Experimental result / Jirarat Ieamsaard / Thanapoom Fuangpian -- 4.4. Detection of solder ball bridging on HGA / Jirarat Ieamsaard / Thanapoom Fuangpian -- 4.4.1. Solder ball bridging defect / Jirarat Ieamsaard / Thanapoom Fuangpian -- 4.4.2. Chain code descriptor-based method / Jirarat Ieamsaard / Thanapoom Fuangpian -- 4.4.3. Morphological template-based method / Jirarat Ieamsaard / Thanapoom Fuangpian -- 4.4.4. Experimental result / Jirarat Ieamsaard / Thanapoom Fuangpian -- 4.5. Detection of missing solders on HGA / Jirarat Ieamsaard / Thanapoom Fuangpian -- 4.5.1. Image acquisition and enhancement / Jirarat Ieamsaard / Thanapoom Fuangpian -- 4.5.2. Clustering of image pixels / Jirarat Ieamsaard / Thanapoom Fuangpian -- 4.5.3. Decision making / Jirarat Ieamsaard / Thanapoom Fuangpian -- 4.5.4. Inspection result / Jirarat Ieamsaard / Thanapoom Fuangpian. 
505 0 |a Note continued: 4.6. Conclusion / Jirarat Ieamsaard / Thanapoom Fuangpian -- 4.7. Bibliography / Jirarat Ieamsaard / Thanapoom Fuangpian -- 5.1. Introduction / Somporn Ruangsinchaiwanich -- 5.2. Surface tension analysis / Somporn Ruangsinchaiwanich -- 5.2.1. Model analysis / Somporn Ruangsinchaiwanich -- 5.2.2. Simulation / Somporn Ruangsinchaiwanich -- 5.3. Analysis of stress performance at different configurations of solder bump positions / Somporn Ruangsinchaiwanich -- 5.3.1. Analysis model / Somporn Ruangsinchaiwanich -- 5.3.2. Design and analysis using FEM / Somporn Ruangsinchaiwanich -- 5.4. Experimental result / Somporn Ruangsinchaiwanich -- 5.5. Conclusion / Somporn Ruangsinchaiwanich -- 5.6. Bibliography / Somporn Ruangsinchaiwanich -- 6.1. Introduction / Wimalin Laosiritaworn -- 6.2. Artificial intelligence tasks in quality control / Wimalin Laosiritaworn -- 6.2.1. Classification and prediction / Wimalin Laosiritaworn -- 6.2.2. Cluster analysis / Wimalin Laosiritaworn. 
505 0 |a Note continued: 6.2.3. Time series analysis / Wimalin Laosiritaworn -- 6.3. AI applications in HDD component quality control / Wimalin Laosiritaworn -- 6.3.1. Multipanel lamination process modeling using ANN / Wimalin Laosiritaworn -- 6.3.2. Control chart pattern recognition with AI in actuator production / Wimalin Laosiritaworn -- 6.3.3. Machine clustering using AI technique / Wimalin Laosiritaworn -- 6.4. Conclusion / Wimalin Laosiritaworn -- 6.5. Bibliography / Wimalin Laosiritaworn -- 7.1. Introduction / Sansanee Auephanwiriyakul / Patison Palee / Orathai Suttijak / Nipon Theera-Umpon -- 7.2. Panorama image construction / Orathai Suttijak / Nipon Theera-Umpon / Patison Palee / Sansanee Auephanwiriyakul -- 7.3. Dimension estimation / Nipon Theera-Umpon / Orathai Suttijak / Patison Palee / Sansanee Auephanwiriyakul -- 7.4. Experiment result / Orathai Suttijak / Nipon Theera-Umpon / Patison Palee / Sansanee Auephanwiriyakul. 
505 0 |a Note continued: 7.5. Conclusion / Nipon Theera-Umpon / Orathai Suttijak / Patison Palee / Sansanee Auephanwiriyakul -- 7.6. Acknowledgment / Orathai Suttijak / Nipon Theera-Umpon / Patison Palee / Sansanee Auephanwiriyakul -- 7.7. Bibliography / Orathai Suttijak / Patison Palee / Sansanee Auephanwiriyakul / Nipon Theera-Umpon -- 8.1. Introduction / Sayan Plong-Ngooluam / Kittikhun Thongpull / Nattha Jindapetch / Pornchai Rakpongsiri -- 8.2. ESD sensitivity test technologies / Sayan Plong-Ngooluam / Kittikhun Thongpull / Nattha Jindapetch / Pornchai Rakpongsiri -- 8.2.1. Human body model testing / Nattha Jindapetch / Kittikhun Thongpull / Sayan Plong-Ngooluam / Pornchai Rakpongsiri -- 8.2.2. Charged device model testing / Nattha Jindapetch / Kittikhun Thongpull / Sayan Plong-Ngooluam / Pornchai Rakpongsiri -- 8.2.3. Machine model testing / Sayan Plong-Ngooluam / Pornchai Rakpongsiri / Nattha Jindapetch / Kittikhun Thongpull. 
505 0 |a Note continued: 8.3. Monitoring of ESD prevention equipment / Sayan Plong-Ngooluam / Kittikhun Thongpull / Nattha Jindapetch / Pornchai Rakpongsiri -- 8.3.1. Grounding and equipotential bonding systems / Sayan Plong-Ngooluam / Kittikhun Thongpull / Nattha Jindapetch / Pornchai Rakpongsiri -- 8.3.2. Ionization / Nattha Jindapetch / Kittikhun Thongpull / Sayan Plong-Ngooluam / Pornchai Rakpongsiri -- 8.3.3. Packaging / Nattha Jindapetch / Kittikhun Thongpull / Sayan Plong-Ngooluam / Pornchai Rakpongsiri -- 8.4. ESD event localization technologies / Pornchai Rakpongsiri / Sayan Plong-Ngooluam / Nattha Jindapetch / Kittikhun Thongpull -- 8.4.1. EMI locators / Pornchai Rakpongsiri / Sayan Plong-Ngooluam / Kittikhun Thongpull / Nattha Jindapetch -- 8.4.2. High-speed oscilloscope-based ESD event localization systems / Kittikhun Thongpull / Pornchai Rakpongsiri / Sayan Plong-Ngooluam / Nattha Jindapetch. 
505 0 |a Note continued: 8.4.3. RFID localization systems / Sayan Plong-Ngooluam / Pornchai Rakpongsiri / Kittikhun Thongpull / Nattha Jindapetch -- 8.4.4. WSN-based localization systems / Kittikhun Thongpull / Pornchai Rakpongsiri / Sayan Plong-Ngooluam / Nattha Jindapetch -- 8.4.5. Hybrid localization systems / Sayan Plong-Ngooluam / Pornchai Rakpongsiri / Kittikhun Thongpull / Nattha Jindapetch -- 8.5. Conclusion / Sayan Plong-Ngooluam / Kittikhun Thongpull / Pornchai Rakpongsiri / Nattha Jindapetch -- 8.6. Bibliography / Pornchai Rakpongsiri / Nattha Jindapetch / Sayan Plong-Ngooluam / Kittikhun Thongpull -- 9.1. Introduction / Suchart Yammen -- 9.2. Morphological template-based method / Suchart Yammen -- 9.2.1. Image subtraction / Suchart Yammen -- 9.2.2. Otsu method / Suchart Yammen -- 9.2.3. Morphological operation / Suchart Yammen -- 9.2.4. Logical operation / Suchart Yammen -- 9.3. Decision model / Suchart Yammen -- 9.4. Application / Suchart Yammen. 
505 0 |a Note continued: 9.5. Conclusion / Suchart Yammen -- 9.6. Bibliography / Suchart Yammen -- 10.1. Introduction / Anan Kruesubthaworn -- 10.2.Computer vision technologies for scratch detection on media surfaces / Anan Kruesubthaworn -- 10.3. Inspection of glue dispenser route / Anan Kruesubthaworn -- 10.4. Conclusion / Anan Kruesubthaworn -- 10.5. Bibliography / Anan Kruesubthaworn -- 11.1. Introduction / Paisarn Muneesawang -- 11.2. Heat-assisted media recording technology / Paisarn Muneesawang -- 11.2.1. HAMR / Paisarn Muneesawang -- 11.2.2. Llo-ordered FePt as HAMR media candidate / Paisarn Muneesawang -- 11.2.3. Magnetic nanoparticle / Paisarn Muneesawang -- 11.3. Inspection procedure / Paisarn Muneesawang -- 11.3.1. Image segmentation / Paisarn Muneesawang -- 11.3.2. Separation of overlapping particles / Paisarn Muneesawang -- 11.4. Measurement of the size distribution / Paisarn Muneesawang -- 11.5. Measurement of dispersion / Paisarn Muneesawang. 
505 0 |a Note continued: 11.5.1. Lennard-Jones potential index / Paisarn Muneesawang -- 11.5.2. Experimental result / Paisarn Muneesawang -- 11.6. Conclusion / Paisarn Muneesawang -- 11.7. Bibliography / Paisarn Muneesawang. 
590 |a ProQuest Ebook Central  |b Ebook Central Academic Complete 
650 0 |a Data disk drives industry. 
650 0 |a Engineering inspection. 
650 6 |a Unités de disques (Informatique)  |x Industrie. 
650 6 |a Contrôle technique. 
650 7 |a Data disk drives industry  |2 fast 
650 7 |a Engineering inspection  |2 fast 
700 1 |a Yammen, Suchart. 
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776 0 8 |i Print version:  |a Muneesawang, Paisarn.  |t Visual Inspection Technology in the Hard Disc Drive Industry.  |d Hoboken : Wiley, ©2015  |z 9781848215917 
830 0 |a Computer engineering series (London, England) 
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