Advanced Measurement and Test IV /

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Collection of selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China. The 37 papers are grouped as follows: Chapter 1: Materials Science; Chapter 2: Material Processing and Testing Technology; Chapter 3...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: International Conference on Advanced Measurement and Test Wuhan, China
Otros Autores: Parvel, Ankdrew (Editor ), Wu, Andy (Editor )
Formato: Electrónico Congresos, conferencias eBook
Idioma:Inglés
Publicado: Zurich : Trans Tech Publications, ©2015.
Colección:Advanced materials research ; v. 1083.
Temas:
Engineering instruments > Congresses.
Materials > Testing > Congresses.
Measurement > Congresses.
Testing > Equipment and supplies > Congresses.
Ingénierie > Instruments > Congrès.
Matériaux > Essais > Congrès.
Mesure > Congrès.
Essais (Technologie) > Appareils et matériel > Congrès.
TECHNOLOGY & ENGINEERING > Engineering (General)
TECHNOLOGY & ENGINEERING > Reference.
Engineering instruments
Materials > Testing
Measurement
Testing > Equipment and supplies
Conference papers and proceedings
Acceso en línea:Texto completo
Descripción
Sumario:Collection of selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China. The 37 papers are grouped as follows: Chapter 1: Materials Science; Chapter 2: Material Processing and Testing Technology; Chapter 3: Monitoring, Detection, Testing and Measurement Systems and Technologies.
Notas:Testing Level Measurement Devices by Imitating Sensor Signals.
Descripción Física:1 online resource (224 pages) : illustrations (some color)
Bibliografía:Includes bibliographical references and index.
ISBN:9783038267591
3038267597

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