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A one-semester course in modeling of VLSI interconnections /
Quantitative understanding of the parasitic capacitances and inductances, and the resultant propagation delays and crosstalk phenomena associated with the metallic interconnections on the very large scale integrated (VLSI) circuits has become extremely important for the optimum design of the state-o...
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York, NY :
Momentum Press,
[2015]
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| Colección: | Electronic circuits and semiconductor devices collection.
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| Temas: | |
| Acceso en línea: | Texto completo |
| Sumario: | Quantitative understanding of the parasitic capacitances and inductances, and the resultant propagation delays and crosstalk phenomena associated with the metallic interconnections on the very large scale integrated (VLSI) circuits has become extremely important for the optimum design of the state-of-the-art integrated circuits. More than 65 percent of the delays on the integrated circuit chip occur in the interconnections and not in the transistors on the chip. Mathematical techniques to model the parasitic capacitances, inductances, propagation delays, crosstalk noise, and electromigration-i. |
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| Descripción Física: | 1 online resource (1 volume) : illustrations |
| Bibliografía: | Includes bibliographical references and index. |
| ISBN: | 9781606505137 1606505130 |