Terrestrial Radiation Effects in ULSI Devices and Electronic Systems.

This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutron...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Ibe, Eishi H.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Hoboken : Wiley, 2014.
Temas:
Electronic circuits > Effect of radiation on.
Integrated circuits > Ultra large scale integration > Reliability.
Integrated circuits > Effect of radiation on.
Circuits électroniques > Effets du rayonnement sur.
Circuits intégrés à ultra-grande échelle > Fiabilité.
Integrated circuits > Effect of radiation on
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