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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems.

This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutron...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Ibe, Eishi H.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Hoboken : Wiley, 2014.
Temas:
Acceso en línea:Texto completo
Descripción
Sumario:This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors.
Notas:Chapter 7: Prediction, Detection and Classification Techniques of Faults, Errors and Failures.
Descripción Física:1 online resource (565 pages)
ISBN:9781118479322
1118479327
9781322592978
1322592977