Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy /

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Oku, Takeo, 1965- (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin ; Boston : De Gruyter, [2014]
Temas:
Transmission electron microscopy.
High resolution electron microscopy.
Nanostructured materials.
Microscopie électronique à transmission.
Microscopie électronique à haute résolution.
Nanomatériaux.
SCIENCE > General.
High resolution electron microscopy
Nanostructured materials
Transmission electron microscopy
Nanostrukturiertes Material
Durchstrahlungselektronenmikroskopie
Hochauflösendes Verfahren
Acceso en línea:Texto completo
Descripción
Sumario:<!Doctype html public ""-//w3c//dtd html 4.0 transitional//en""> <html><head> <meta http-equiv=content-type content=""text/html; charset=iso-8859-1""> <meta content=""mshtml 6.00.6000.17110"" name=generator></head> <body> High-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes. </body></html>
Descripción Física:1 online resource (viii, 168 pages .)
Bibliografía:Includes bibliographical references and index.
ISBN:3110305011
9783110305012
9781523100545
1523100540
9783110388046
3110388049

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