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Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China /

Collection of selected, peer reviewed papers from the 2014 International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China. The 380 papers are grouped as follows: Chapter 1: Measurement Science, Methods and Techniques of Measurements, Chapter...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: International Conference on Measurement, Instrumentation and Automation Shanghai, China
Otros Autores: Yarlagadda, Prasad (Editor ), Kim, Yun-Hae (Editor )
Formato: Electrónico Congresos, conferencias eBook
Idioma:Inglés
Publicado: Zurich, Switzerland : Trans Tech Publications, [2014]
Colección:Applied mechanics and materials ; v. 568-570.
Temas:
Acceso en línea:Texto completo
Descripción
Sumario:Collection of selected, peer reviewed papers from the 2014 International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China. The 380 papers are grouped as follows: Chapter 1: Measurement Science, Methods and Techniques of Measurements, Chapter 2: Signal Acquisition and Data Processing Techniques, Chapter 3: Research and Design of Measurement Instruments, Chapter 4: Sensors Technology, Chapter 5: Image and Video Processing, Chapter 6: Artificial Intelligence, Optimization Algorithms and Computational Mathematics, Chapter 7: Mechatronics an.
Descripción Física:1 online resource (2012 pages) : illustrations (some color), graphs, tables
Bibliografía:Includes bibliographical references at the end of each chapters and indexes.
ISBN:9783038265214
3038265217
ISSN:1662-7482 ;