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Atomic force microscopy in nanobiology /

Recent developments in atomic force microscopy (AFM) have been accomplished through various technical and instrumental innovations, including high-resolution and recognition imaging technology under physiological conditions, fast-scanning AFM, and general methods for cantilever modification and forc...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Takeyasu, Kunio (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Boca Raton, Florida : CRC Press, [2014]
Temas:
Acceso en línea:Texto completo

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