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Atomic force microscopy in nanobiology /

Recent developments in atomic force microscopy (AFM) have been accomplished through various technical and instrumental innovations, including high-resolution and recognition imaging technology under physiological conditions, fast-scanning AFM, and general methods for cantilever modification and forc...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Takeyasu, Kunio (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Boca Raton, Florida : CRC Press, [2014]
Temas:
Acceso en línea:Texto completo
Descripción
Sumario:Recent developments in atomic force microscopy (AFM) have been accomplished through various technical and instrumental innovations, including high-resolution and recognition imaging technology under physiological conditions, fast-scanning AFM, and general methods for cantilever modification and force measurement. All these techniques are now highly powerful not only in material sciences but also in basic biological sciences. There are many nanotechnology books that focus on materials, instruments, and applications in engineering and medicine, but only a few of them are directed toward basic.
Descripción Física:1 online resource (444 pages) : illustrations, tables, photographs
Bibliografía:Includes bibliographical references.
ISBN:9789814411592
9814411590
9814411582
9789814411585