Defects and diffusion in semiconductors. an annual retrospective / XI :

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This eleventh volume in the series covering the latest results in the field includes abstracts of papers which have appeared since the publication of Annual Retrospective X (Volume 272). As well as the 295 metals abstracts, the issue includes - in line with the new editorial policy of including orig...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Fisher, D. J.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Stafa-Zuerich, Switzerland : TTP, Trans Tech Publications, [2008]
Colección:Diffusion and defect data. Defect and diffusion forum ; v. 282.
Temas:
Semiconductors > Defects.
Semiconductors > Diffusion.
Semi-conducteurs > Défauts.
TECHNOLOGY & ENGINEERING > Electronics > Semiconductors.
TECHNOLOGY & ENGINEERING > Electronics > Solid State.
Semiconductors > Defects
Semiconductors > Diffusion
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Defects and Diffusion in Semicondutors, 2009; Table of Contents; Structural and Electron-Hopping Studies of Pr and Nd Substituted La2/3Ba1/3MnO3 Manganites; Recrystallization Annealing of Cold Rolled 9Cr 1Mo Ferritic Steel Containing Silicon; Quantitative Concept for Morphological Stability Analysis of Liquid-Solid Interface in Rapid Solidification of Dilute Binary Alloys; Studies of the Spin Hamiltonian Parameters for NiX2 and CdX2:Ni2+ (X=Cl, Br); Abstracts; Keywords Index; Authors Index.

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