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Scanning Probe Microscopy for Industrial Applications : Nanomechanical Characterization.
Describes new state-of-the-science tools and their contribution to industrial R & D With contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better qual...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Hoboken, New Jersey :
Wiley,
2014.
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| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Scanning Probe Microscopy in Industrial Applications: Nanomechanical Characterization; Copyright; Contents; Contributors List; Preface; Acknowledgments; Chapter 1 Overview of Atomic Force Microscopy; 1.1 A Word on Nomenclature; 1.2 Atomic Force Microscopy-The Appeal to Industrial R & D; 1.3 Mechanical Properties; 1.4 Overview of AFM Operation; 1.4.1 AFM Hardware; 1.4.2 Cantilevers and Probes; 1.4.3 Optical Detection System; 1.4.4 x-y-z Scanner; 1.4.5 AFM Software; 1.4.6 Calibrations; 1.4.7 Cantilever Spring Constant; 1.4.8 Tip Shape Calibration; 1.5 Nanomechanical Methods Surveyed in Book.
- 1.6 Industries RepresentedAcknowledgments; References; Chapter 2 Understanding the Tip-Sample Contact: An Overview of Contact Mechanics from the Macro- to the Nanoscale; 2.1 Hertz Equations for Elastic Contact; 2.1.1 Introduction; 2.1.2 Hertz Equations; 2.1.3 Assumptions of Hertz model; 2.1.4 Worked Examples: Hertz Mechanics of Diamond Tips on Stiff and Compliant Substrates; 2.2 Adhesive Contacts; 2.2.1 introduction to Adhesion; 2.2.2 Basic Physics and Mathematics of Surface Interactions; 2.2.3 Derjaguin-Müller-Toporov and Johnson-Kendall-Roberts Models of Adhesion.
- 2.2.4 More Realistic Picture of Adhesion2.2.5 Continuing the Worked Examples: Adding Adhesion to Diamond Tips on Stiff and Compliant Substrates; 2.3 Further Extensions of Continuum Contact Mechanics Models; 2.3.1 Tip Shape Differs from a Paraboloid; 2.3.2 Flattened Tip Shapes; 2.3.3 Axisymmetric Power Law Tip Shapes; 2.3.4 Anisotropic Elasticity, Viscoelastic, and Plastic Effects; 2.4 Thin Films; 2.5 Tangential Forces; 2.5.1 Three Possible Cases for a Tangentially Loaded Contact; 2.5.2 Active Debate over the Behavior of the Shear Stress; 2.5.3 Lateral Stiffness.
- 2.6 Application of Continuum Mechanics to Nanoscale Contacts2.6.1 Unique Considerations of Nanoscale Contacts; 2.6.2 Evidence of Applicability of Continuum Contact Mechanics at the Nanoscale; Acknowledgments; APPENDIX 2A Surface Energy and Work of Adhesion; References; Chapter 3 Understanding Surface Forces Using Static and Dynamic Approach-Retraction Curves; 3.1 Tip-Sample Interaction Forces; 3.1.1 Piecewise Linear Contact; 3.1.2 Piecewise Linear Attractive-Repulsive Contact; 3.1.3 Lennard-Jones Potential; 3.1.4 Derjaguin-Müller-Toporov + van der Waals Model; 3.1.5 Viscoelastic Forces.
- 3.1.6 Capillary Forces3.2 Static F-Z Curves; 3.2.1 Conversion of F-Z Curves into F-d Curves; 3.2.2 Examples from Literature; 3.2.3 Uncertainties and Sources of Error; 3.3 Dynamic Amplitude/Phase-Distance Curves; 3.3.1 Theory; 3.3.2 Interpreting the Virial; 3.3.3 Physics of Amplitude Reduction; 3.3.4 Attractive and Repulsive Regimes of Interaction; 3.3.5 Reconstruction of Forces; 3.4 Brief Guide to VEDA Simulations; 3.4.1 F-Z Curve Tutorial; 3.4.2 Amplitude/Phase-Distance Curves Tutorial; 3.4.3 Advanced Amplitude/Phase-Distance Curves Tutorial; 3.5 Conclusions; Glossary; References.