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Attosecond and XUV Spectroscopy : Ultrafast Dynamics and Spectroscopy.
This book provides fundamental knowledge in the fields of attosecond science and free electron lasers, based on the insight that the further development of both disciplines can greatly benefit from mutual exposure and interaction between the two communities. With respect to the interaction of high i...
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Wiley-VCH,
2013.
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| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Cover; Titlepage; Copyright; Contents; List of Contributors; 1 Attosecond and XUV Physics: Ultrafast Dynamics and Spectroscopy; 1.1 Introduction; 1.2 The Emergence of Attosecond Science; 1.2.1 Attosecond Pulse Trains and Isolated Attosecond Pulses; 1.2.2 Characterization of Attosecond Laser Pulses; 1.2.3 Experimental Challenges in Attosecond Science; 1.2.4 Attosecond Science as a Driver for Technological Developments; 1.3 Applications of Attosecond Laser Pulses; 1.4 Ultrafast Science Using XUV/X-ray Free Electron Lasers; 1.5 The Interplay between Experiment and Theory
- 1.6 Conclusion and OutlookReferences; Part One Laser Techniques; 2 Ultrafast Laser Oscillators and Amplifiers; 2.1 Introduction; 2.2 Mode-Locking and Few-Cycle Pulse Generation; 2.3 High-Energy Oscillators; 2.4 Laser Amplifiers; References; 3 Ultrashort Pulse Characterization; 3.1 Motivation: Why Ultrafast Metrology?; 3.1.1 Ultrafast Science: High-Speed Photography in the Extreme; 3.2 Formal Description of Ultrashort Pulses; 3.2.1 Sampling Theorem; 3.2.2 Chronocyclic Representation of Ultrafast Pulses; 3.2.3 Space-Time Coupling; 3.2.4 Accuracy, Precision and Consistency
- 3.3 Linear Filter Analysis3.4 Ultrafast Metrology in the Visible to Infrared; 3.4.1 Temporal Correlations; 3.4.2 Spectrography; 3.4.3 Sonography; 3.4.4 Tomography; 3.4.5 Interferometry; 3.5 Ultrafast Metrology in the Extreme Ultraviolet; 3.5.1 Complete Characterization of Ultrashort XUV Pulses via Photoionization Spectroscopy; 3.5.2 XUV Interferometry; 3.6 Summary; References; 4 Carrier Envelope Phase Stabilization; 4.1 Introduction; 4.2 CEP Fundamentals; 4.2.1 Time Domain Representation; 4.2.2 Frequency Domain Representation; 4.3 Stabilization Loop Fundamentals; 4.3.1 The Noisy Source
- 4.3.2 Noise Detection4.3.3 Open-Loop Noise Analysis; 4.3.4 Feedback; 4.3.5 Closed-Loop Noise Analysis; 4.4 CEP in Oscillators; 4.4.1 Oscillators Peculiarities; 4.4.2 CEP Detection; 4.4.3 Actuation; 4.5 CEP in Amplifiers; 4.5.1 Amplifier Peculiarities; 4.5.2 CEP Detection; 4.5.3 Actuation; 4.5.4 Feedback Results; 4.5.5 Parametric Amplification; 4.6 Conclusion; References; 5 Towards Tabletop X-Ray Lasers; 5.1 Context and Objectives; 5.2 Choice of Plasma-Based Soft X-Ray Amplifier; 5.2.1 Basic Aspects of High Harmonic Amplification; 5.2.2 Basic Aspects of Plasma Amplifiers
- 5.3 2D Fluid Modeling and 3D Ray Trace5.3.1 ARWEN Code; 5.3.2 Model to Obtain 2D Maps of Atomic Data; 5.4 The Bloch-Maxwell Treatment; 5.5 Stretched Seed Amplification; 5.6 Conclusion; References; Part Two Theoretical Methods; 6 Ionization in Strong Low-Frequency Fields; 6.1 Preliminaries; 6.2 Speculative Thoughts; 6.3 Basic Formalism; 6.3.1 Hamiltonians and Gauges; 6.3.2 Formal Solutions; 6.4 The Strong-Field Approximation; 6.4.1 The Volkov Propagator and the Classical Connection; 6.4.2 Transition Amplitudes in the SFA; 6.5 Strong-Field Ionization: Exponential vs. Power Law