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Particle and particle systems characterization : small-angle scattering (SAS) applications /

Small-angle scattering (SAS) is the premier technique for the characterization of disordered nanoscale particle ensembles. SAS is produced by the particle as a whole and does not depend in any way on the internal crystal structure of the particle. Since the first applications of X-ray scattering in...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Gille, Wilfried (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Boca Raton, Florida : CRC Press, 2013.
Temas:
Acceso en línea:Texto completo

MARC

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505 0 |a 1. Scattering experiment and structure functions : particles and the correlation function of small-angle scattering -- 2. Chord length distribution densities of selected elementary geometric figures -- 3. Chord length distributions of infinitely long cylinders -- 4. Particle-to-particle interference : a useful tool -- 5. Scattering patterns and structure functions of Boolean models -- 6. The "dead leaves" model -- 7. Tessellations, fragment particles and puzzles -- 8. Volume fraction of random two-phase samples for a fixed order range L form (r, L) -- 9. Interrelations between the moments of the chord length distributions of random two-phase systems -- 10. Exercises on problems of particle characterization : examples. 
520 |a Small-angle scattering (SAS) is the premier technique for the characterization of disordered nanoscale particle ensembles. SAS is produced by the particle as a whole and does not depend in any way on the internal crystal structure of the particle. Since the first applications of X-ray scattering in the 1930s, SAS has developed into a standard method in the field of materials science. SAS is a non-destructive method and can be directly applied for solid and liquid samples. Particle and Particle Systems Characterization: Small-Angle Scattering (SAS) Applications is geared to any scientist who mig. 
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