Transmission Electron Microscopy : a Textbook for Materials Science /

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This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Williams, David B.
Otros Autores: Carter, C. Barry
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Boston, MA : Springer US, 1996.
Temas:
Microscopy.
Surfaces (Physics)
Microscopie.
Surfaces (Physique)
microscopy.
Microscopy
Acceso en línea:Texto completo
Tabla de Contenidos:
  • 1 The Transmission Electron Microscope
  • 2 Scattering and Diffraction
  • 3 Elastic Scattering
  • 4 Inelastic Scattering and Beam Damage
  • 5 Electron Sources
  • 6 Lenses, Apertures, and Resolution
  • 7 How to "See" Electrons
  • 8 Pumps and Holders
  • 9 The Instrument
  • 10 Specimen Preparation
  • 11 Diffraction Patterns
  • 12 Thinking in Reciprocal Space
  • 13 Diffracted Beams
  • 14 Bloch Waves
  • 15 Dispersion Surfaces
  • 16 Diffraction from Crystals
  • 17 Diffraction from Small Volumes
  • 18 Indexing Diffraction Patterns
  • 19 Kikuchi Diffraction
  • 20 Obtaining CBED Patterns
  • 21 Using Convergent-Beam Techniques
  • 22 Imaging in the TEM
  • 23 Thickness and Bending Effects
  • 24 Planar Defects
  • 25 Strain Fields
  • 26 Weak-Beam Dark-Field Microscopy
  • 27 Phase-Contrast Images
  • 28 High-Resolution TEM
  • 29 Image Simulation
  • 30 Quantifying and Processing HRTEM Images
  • 31 Other Imaging Techniques
  • 32 X-ray Spectrometry
  • 33 The XEDS-TEM Interface
  • 34 Qualitative X-ray Analysis
  • 35 Quantitative X-ray Microanalysis
  • 36 Spatial Resolution and Minimum Detectability
  • 37 Electron Energy-Loss Spectrometers
  • 38 The Energy-Loss Spectrum
  • 39 Microanalysis with Ionization-Loss Electrons
  • 40 Everything Else in the Spectrum
  • Acknowledgements for Figures.

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