Transmission Electron Microscopy : a Textbook for Materials Science /

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This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Williams, David B.
Otros Autores: Carter, C. Barry
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Boston, MA : Springer US, 1996.
Temas:
Microscopy.
Surfaces (Physics)
Microscopie.
Surfaces (Physique)
microscopy.
Microscopy
Acceso en línea:Texto completo

MARC

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245 1 0 |a Transmission Electron Microscopy :  |b a Textbook for Materials Science /  |c by David B. Williams, C. Barry Carter. 
260 |a Boston, MA :  |b Springer US,  |c 1996. 
300 |a 1 online resource (xxix, 729 pages) 
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520 |a This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams. 
505 0 |a 1 The Transmission Electron Microscope -- 2 Scattering and Diffraction -- 3 Elastic Scattering -- 4 Inelastic Scattering and Beam Damage -- 5 Electron Sources -- 6 Lenses, Apertures, and Resolution -- 7 How to "See" Electrons -- 8 Pumps and Holders -- 9 The Instrument -- 10 Specimen Preparation -- 11 Diffraction Patterns -- 12 Thinking in Reciprocal Space -- 13 Diffracted Beams -- 14 Bloch Waves -- 15 Dispersion Surfaces -- 16 Diffraction from Crystals -- 17 Diffraction from Small Volumes -- 18 Indexing Diffraction Patterns -- 19 Kikuchi Diffraction -- 20 Obtaining CBED Patterns -- 21 Using Convergent-Beam Techniques -- 22 Imaging in the TEM -- 23 Thickness and Bending Effects -- 24 Planar Defects -- 25 Strain Fields -- 26 Weak-Beam Dark-Field Microscopy -- 27 Phase-Contrast Images -- 28 High-Resolution TEM -- 29 Image Simulation -- 30 Quantifying and Processing HRTEM Images -- 31 Other Imaging Techniques -- 32 X-ray Spectrometry -- 33 The XEDS-TEM Interface -- 34 Qualitative X-ray Analysis -- 35 Quantitative X-ray Microanalysis -- 36 Spatial Resolution and Minimum Detectability -- 37 Electron Energy-Loss Spectrometers -- 38 The Energy-Loss Spectrum -- 39 Microanalysis with Ionization-Loss Electrons -- 40 Everything Else in the Spectrum -- Acknowledgements for Figures. 
590 |a ProQuest Ebook Central  |b Ebook Central Academic Complete 
650 0 |a Microscopy. 
650 0 |a Surfaces (Physics) 
650 6 |a Microscopie. 
650 6 |a Surfaces (Physique) 
650 7 |a microscopy.  |2 aat 
650 7 |a Microscopy  |2 fast 
650 7 |a Surfaces (Physics)  |2 fast 
700 1 |a Carter, C. Barry. 
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776 0 8 |i Print version:  |z 9780306453243 
856 4 0 |u https://ebookcentral.uam.elogim.com/lib/uam-ebooks/detail.action?docID=3084962  |z Texto completo 
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994 |a 92  |b IZTAP 

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