Metal impurities in silicon-device fabrication /
Metal Impurities in Silicon-Device Fabrication treats the transition-metal impurities generated during silicon sample and device fabrication. The different mechanisms responsible for contamination are discussed, and a survey given of their impact on device performance. The specific properties of mai...
Clasificación: | Libro Electrónico |
---|---|
Autor principal: | Graff, Klaus, 1931- (Autor) |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Berlin, Heidelberg :
Springer Berlin Heidelberg,
1995.
|
Colección: | Springer series in materials science ;
24. |
Temas: | |
Acceso en línea: | Texto completo |
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