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Cluster secondary ion mass spectrometry : principles and applications /
This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, e...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Hoboken, New Jersey :
Wiley,
©2013.
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| Temas: | |
| Acceso en línea: | Texto completo |
MARC
| LEADER | 00000cam a2200000 a 4500 | ||
|---|---|---|---|
| 001 | EBOOKCENTRAL_ocn841914445 | ||
| 003 | OCoLC | ||
| 005 | 20240329122006.0 | ||
| 006 | m o d | ||
| 007 | cr |n||||||||| | ||
| 008 | 130418s2013 nju ob 001 0 eng d | ||
| 040 | |a MHW |b eng |e pn |c MHW |d OCLCO |d IDEBK |d N$T |d DG1 |d CUS |d YDXCP |d E7B |d COO |d NOC |d OCLCO |d RECBK |d OCLCF |d DEBSZ |d OCLCQ |d OCLCO |d OCLCQ |d COCUF |d DG1 |d MOR |d LIP |d PIFPO |d ZCU |d MERUC |d OCLCQ |d U3W |d DEBBG |d OCLCQ |d STF |d WRM |d NRAMU |d ICG |d INT |d VT2 |d OCLCQ |d WYU |d TKN |d OCLCQ |d VLB |d DKC |d OCLCQ |d UKAHL |d OCLCO |d OCLCQ |d OCLCO |d OCLCL |d OCLCQ |d OCLCL | ||
| 019 | |a 864915297 |a 999839827 | ||
| 020 | |a 9781118589335 |q (electronic bk.) | ||
| 020 | |a 1118589335 |q (electronic bk.) | ||
| 020 | |a 9781118589250 |q (electronic bk.) | ||
| 020 | |a 1118589254 |q (electronic bk.) | ||
| 020 | |a 0470886056 | ||
| 020 | |a 9780470886052 | ||
| 020 | |a 9781299475878 |q (MyiLibrary) | ||
| 020 | |a 1299475876 |q (MyiLibrary) | ||
| 020 | |a 9781118589243 |q (electronic bk.) | ||
| 020 | |a 1118589246 |q (electronic bk.) | ||
| 020 | |z 1118589254 | ||
| 020 | |z 9780470886052 | ||
| 028 | 0 | 1 | |a EB00063935 |b Recorded Books |
| 029 | 1 | |a AU@ |b 000051628931 | |
| 029 | 1 | |a CHBIS |b 010026885 | |
| 029 | 1 | |a CHNEW |b 000941762 | |
| 029 | 1 | |a CHVBK |b 480220395 | |
| 029 | 1 | |a DEBBG |b BV041829197 | |
| 029 | 1 | |a DEBBG |b BV041912822 | |
| 029 | 1 | |a DEBBG |b BV044174646 | |
| 029 | 1 | |a DEBSZ |b 431386226 | |
| 029 | 1 | |a DEBSZ |b 449354415 | |
| 029 | 1 | |a DEBSZ |b 485036762 | |
| 029 | 1 | |a NZ1 |b 15340513 | |
| 029 | 1 | |a DKDLA |b 820050-katalog:9920695536905762 | |
| 035 | |a (OCoLC)841914445 |z (OCoLC)864915297 |z (OCoLC)999839827 | ||
| 050 | 4 | |a QD96.S43 .M34 2013 | |
| 072 | 7 | |a SCI |x 013010 |2 bisacsh | |
| 082 | 0 | 4 | |a 543.65 |
| 049 | |a UAMI | ||
| 100 | 1 | |a Mahoney, Christine M., |d 1975- |1 https://id.oclc.org/worldcat/entity/E39PCjrG7cxgRw7tDxFPpgTHyd | |
| 245 | 1 | 0 | |a Cluster secondary ion mass spectrometry : |b principles and applications / |c edited by Christine M. Mahoney. |
| 260 | |a Hoboken, New Jersey : |b Wiley, |c ©2013. | ||
| 300 | |a 1 online resource (350 pages) | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 588 | 0 | |a Online resource; title from PDF title page (Wiley; viewed on May 28, 2013). | |
| 520 | |a This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | 0 | |g Machine generated contents note: |g 1.1. |t Secondary Ion Mass Spectrometry in a Nutshell / |r Greg Gillen / |r Christine M. Mahoney -- |g 1.1.1. |t SIMS Imaging / |r Greg Gillen / |r Christine M. Mahoney -- |g 1.1.2. |t SIMS Depth Profiling / |r Greg Gillen / |r Christine M. Mahoney -- |g 1.2. |t Basic Cluster SIMS Theory / |r Greg Gillen / |r Christine M. Mahoney -- |g 1.3. |t Cluster SIMS: An Early History / |r Greg Gillen / |r Christine M. Mahoney -- |g 1.3.1. |t Nonlinear Sputter Yield Enhancements / |r Greg Gillen / |r Christine M. Mahoney -- |g 1.3.2. |t Molecular Depth Profiling / |r Greg Gillen / |r Christine M. Mahoney -- |g 1.4. |t Recent Developments / |r Greg Gillen / |r Christine M. Mahoney -- |g 1.5. |t About this Book / |r Greg Gillen / |r Christine M. Mahoney -- |t Acknowledgment / |r Greg Gillen / |r Christine M. Mahoney -- |t References / |r Greg Gillen / |r Christine M. Mahoney -- |g 2.1. |t Introduction / |r Arnaud Delcorte / |r Bartlomiej Czerwinski / |r Oscar A. Restrepo -- |g 2.2. |t Molecular Dynamics Simulations of Sputtering with Clusters / |r Arnaud Delcorte / |r Bartlomiej Czerwinski / |r Oscar A. Restrepo -- |g 2.2.1. |t Cluster Effect / |r Arnaud Delcorte / |r Bartlomiej Czerwinski / |r Oscar A. Restrepo -- |g 2.2.2. |t Computer Simulations and the Molecular Dynamics "Experiment" / |r Arnaud Delcorte / |r Bartlomiej Czerwinski / |r Oscar A. Restrepo -- |g 2.2.3. |t Light and Heavy Element Clusters, and the Importance of Mass Matching / |r Arnaud Delcorte / |r Bartlomiej Czerwinski / |r Oscar A. Restrepo -- |g 2.2.4. |t Structural Effects in Organic Materials / |r Arnaud Delcorte / |r Bartlomiej Czerwinski / |r Oscar A. Restrepo -- |g 2.2.4.1. |t Amorphous Molecular Solids and Polymers / |r Arnaud Delcorte / |r Bartlomiej Czerwinski / |r Oscar A. Restrepo -- |g 2.2.4.2. |t Organic Crystals / |r Arnaud Delcorte / |r Bartlomiej Czerwinski / |r Oscar A. Restrepo -- |g 2.2.4.3. |t Thin Organic Layers on Metal Substrates / |r Arnaud Delcorte / |r Bartlomiej Czerwinski / |r Oscar A. Restrepo -- |g 2.2.4.4. |t Hybrid Metal[-]Organic Samples / |r Arnaud Delcorte / |r Bartlomiej Czerwinski / |r Oscar A. Restrepo -- |g 2.2.5. |t Induced Chemistry / |r Arnaud Delcorte / |r Bartlomiej Czerwinski / |r Oscar A. Restrepo -- |g 2.2.6. |t Multiple Hits and Depth Profiling / |r Arnaud Delcorte / |r Bartlomiej Czerwinski / |r Oscar A. Restrepo -- |g 2.2.7. |t From Small Polyatomic Projectiles to Massive Clusters / |r Arnaud Delcorte / |r Bartlomiej Czerwinski / |r Oscar A. Restrepo -- |g 2.2.7.1. |t Light-Element Clusters / |r Arnaud Delcorte / |r Bartlomiej Czerwinski / |r Oscar A. Restrepo -- |g 2.2.7.2. |t Large Argon Clusters / |r Arnaud Delcorte / |r Oscar A. Restrepo / |r Bartlomiej Czerwinski -- |g 2.2.7.3. |t Massive Gold Clusters / |r Arnaud Delcorte / |r Bartlomiej Czerwinski / |r Oscar A. Restrepo -- |g 2.3. |t Other Models / |r Arnaud Delcorte / |r Bartlomiej Czerwinski / |r Oscar A. Restrepo -- |g 2.3.1. |t Analytical Models: From Linear Collision Cascades to Fluid Dynamics / |r Arnaud Delcorte / |r Bartlomiej Czerwinski / |r Oscar A. Restrepo -- |g 2.3.2. |t Recent Developments and Hybrid Approaches / |r Arnaud Delcorte / |r Bartlomiej Czerwinski / |r Oscar A. Restrepo -- |g 2.4. |t Conclusions / |r Arnaud Delcorte / |r Bartlomiej Czerwinski / |r Oscar A. Restrepo -- |t Acknowledgments / |r Arnaud Delcorte / |r Bartlomiej Czerwinski / |r Oscar A. Restrepo -- |t References / |r Arnaud Delcorte / |r Bartlomiej Czerwinski / |r Oscar A. Restrepo -- |g 3.1. |t Introduction / |r Albert J. Fahey -- |g 3.2. |t Research Needs that have Influenced the Development of Primary Ion Sources for Sputtering / |r Albert J. Fahey -- |g 3.3. |t Functional Aspects of Various Ion Sources / |r Albert J. Fahey -- |g 3.3.1. |t Energy Spread in the Beam / |r Albert J. Fahey -- |g 3.3.2. |t Point-Source Ionization / |r Albert J. Fahey -- |g 3.3.3. |t Stable Emission / |r Albert J. Fahey -- |g 3.3.4. |t Ion Reactivity / |r Albert J. Fahey -- |g 3.3.5. |t Source Lifetime / |r Albert J. Fahey -- |g 3.3.6. |t Penetration Depth and Surface Energy Spread of the Projectile / |r Albert J. Fahey -- |g 3.4. |t Atomic Ion Sources / |r Albert J. Fahey -- |g 3.4.1. |t Field Emission / |r Albert J. Fahey -- |g 3.4.2. |t Radio Frequency (RF) Ionization / |r Albert J. Fahey -- |g 3.4.3. |t Electron Impact / |r Albert J. Fahey -- |g 3.4.4. |t Thermal Ionization / |r Albert J. Fahey -- |g 3.4.5. |t DC-Glow Discharge / |r Albert J. Fahey -- |g 3.4.6. |t Sputtering / |r Albert J. Fahey -- |g 3.5. |t Molecular Ion Sources / |r Albert J. Fahey -- |g 3.5.1. |t Field Emission / |r Albert J. Fahey -- |g 3.5.2. |t Radio Frequency Discharge / |r Albert J. Fahey -- |g 3.5.3. |t Electron Impact / |r Albert J. Fahey -- |g 3.5.4. |t DC-Glow Discharge / |r Albert J. Fahey -- |g 3.5.5. |t Sputtering / |r Albert J. Fahey -- |g 3.6. |t Cluster Ion Sources / |r Albert J. Fahey -- |g 3.6.1. |t Jets and Electron Impact (Massive Gas Clusters) / |r Albert J. Fahey -- |g 3.6.2. |t Field Emission / |r Albert J. Fahey -- |g 3.7. |t Summary / |r Albert J. Fahey -- |t References / |r Albert J. Fahey -- |g 4.1. |t Introduction / |r Christine M. Mahoney -- |g 4.2. |t Cluster Sources in Static SIMS / |r Christine M. Mahoney -- |g 4.2.1. |t Brief Introduction to Static SIMS / |r Christine M. Mahoney -- |g 4.2.2. |t Analysis beyond the Static Limit / |r Christine M. Mahoney -- |g 4.2.3. |t Increased Ion Yields / |r Christine M. Mahoney -- |g 4.2.4. |t Decreased Charging / |r Christine M. Mahoney -- |g 4.2.5. |t Surface Cleaning / |r Christine M. Mahoney -- |g 4.3. |t Experimental Considerations / |r Christine M. Mahoney -- |g 4.3.1. |t When to Employ Cluster Sources as Opposed to Atomic Sources / |r Christine M. Mahoney -- |g 4.3.2. |t Type of Cluster Source Used / |r Christine M. Mahoney -- |g 4.3.2.1. |t Liquid Metal Ion Gun (LMIG) / |r Christine M. Mahoney -- |g 4.3.2.2. |t C60+ for Mass Spectral Analysis and Imaging Applications / |r Christine M. Mahoney -- |g 4.3.2.3. |t Gas Cluster Ion Beam (GCIB) / |r Christine M. Mahoney -- |g 4.3.2.4. |t Au4004+ / |r Christine M. Mahoney -- |g 4.3.2.5. |t Other Sources / |r Christine M. Mahoney -- |g 4.3.3. |t Cluster Size Considerations / |r Christine M. Mahoney -- |g 4.3.4. |t Beam Energy / |r Christine M. Mahoney -- |g 4.3.5. |t Sample Temperature / |r Christine M. Mahoney -- |g 4.3.6. |t Matrix-Enhanced and Metal-Assisted Cluster SIMS / |r Christine M. Mahoney -- |g 4.3.7. |t Matrix Effects / |r Christine M. Mahoney -- |g 4.3.8. |t Other Important Factors / |r Christine M. Mahoney -- |g 4.4. |t Data Analysis Methods / |r Christine M. Mahoney -- |g 4.4.1. |t Principal Components Analysis / |r Christine M. Mahoney -- |g 4.4.1.1. |t Basic Principles of PCA / |r Christine M. Mahoney -- |g 4.4.1.2. |t Examples of PCA in the Literature / |r Christine M. Mahoney -- |g 4.4.2. |t Gentle SIMS (G-SIMS) / |r Christine M. Mahoney -- |g 4.5. |t Other Relevant Surface Mass-Spectrometry-Based Methods / |r Christine M. Mahoney -- |g 4.5.1. |t Desorption Electrospray Ionization (DESI) / |r Christine M. Mahoney -- |g 4.5.2. |t Plasma Desorption Ionization Methods / |r Christine M. Mahoney -- |g 4.5.3. |t Electrospray Droplet Impact Source for SIMS / |r Christine M. Mahoney -- |g 4.6. |t Advanced Mass Spectrometers for SIMS / |r Christine M. Mahoney -- |g 4.7. |t Conclusions / |r Christine M. Mahoney -- |t Appendix A: Useful Lateral Resolution / |r Christine M. Mahoney -- |t References / |r Christine M. Mahoney -- |g 5.1. |t Introduction / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.2. |t Historical Perspectives / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.3. |t Depth Profiling in Heterogeneous Systems / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.3.1. |t Introduction / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.3.2. |t Quantitative Depth Profiling / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.3.3. |t Reconstruction of 3D Images / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.3.4. |t Matrix Effects in Heterogeneous Systems / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.4. |t Erosion Dynamics Model of Molecular Sputter Depth Profiling / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.4.1. |t Parent Molecule Dynamics / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.4.2. |t Constant Erosion Rate / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.4.3. |t Fluence-Dependent Erosion Rate / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.4.4. |t Using Mass Spectrometric Signal Decay to Measure Damage Parameters / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.4.5. |t Surface Transients / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.4.6. |t Fragment Dynamics / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.4.7. |t Conclusions / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.5. |t Chemistry of Atomic Ion Beam Irradiation in Organic Materials / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.5.1. |t Introduction / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.5.2. |t Understanding the Basics of Ion Irradiation Effects in Molecular Solids / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.5.3. |t Ion Beam Irradiation and the Gel Point / |r Christine M. |
| 505 | 0 | 0 | |r Mahoney / |r Andreas Wucher -- |g 5.5.4. |t Chemistry of Cluster Ion Beams / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.5.5. |t Chemical Structure Changes and Corresponding Changes in Depth Profile Shapes / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.6. |t Optimization of Experimental Parameters for Organic Depth Profiling / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.6.1. |t Introduction / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.6.2. |t Organic Delta Layers for Optimization of Experimental Parameters / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.6.3. |t Sample Temperature / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.6.4. |t Understanding the Role of Beam Energy During Organic Depth Profiling / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.6.5. |t Optimization of Incidence Angle / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.6.6. |t Effect of Sample Rotation / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.6.7. |t Ion Source Selection / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.6.7.1. |t SF5+ and Other Small Cluster Ions / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.6.7.2. |t C60n+ and Similar Carbon Cluster Sources / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.6.7.3. |t Gas Cluster Ion Beam (GCIB) / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.6.7.4. |t Low Energy Reactive Ion Beams / |r Christine M. Mahoney / |r Andreas Wucher. |
| 505 | 0 | 0 | |g Note continued: |g 5.6.7.5. |t Electrospray Droplet Impact (EDI) Source for SIMS / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.6.7.6. |t Liquid Metal Ion Gun Clusters (Bi3+ and Au3+) / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.6.8. |t C60+/Ar+ Co-sputtering / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.6.9. |t Chamber Backfilling with a Free Radical Inhibitor Gas / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.6.10. |t Other Considerations for Organic Depth Profiling Experiments / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.6.11. |t Molecular Depth Profiling: Novel Approaches and Methods / |r Christine M. Mahoney / |r Andreas Wucher -- |g 5.7. |t Conclusions / |r Christine M. Mahoney / |r Andreas Wucher -- |t References / |r Christine M. Mahoney / |r Andreas Wucher -- |g 6.1. |t Introduction / |r Gregory L. Fisher / |r Andreas Wucher / |r Christine M. Mahoney -- |g 6.2. |t General Strategies / |r Christine M. Mahoney / |r Gregory L. Fisher / |r Andreas Wucher -- |g 6.2.1. |t Three-Dimensional Sputter Depth Profiling / |r Andreas Wucher / |r Gregory L. Fisher / |r Christine M. Mahoney -- |g 6.2.2. |t Wedge Beveling / |r Christine M. Mahoney / |r Gregory L. Fisher / |r Andreas Wucher -- |g 6.2.3. |t Physical Cross Sectioning / |r Andreas Wucher / |r Gregory L. Fisher / |r Christine M. Mahoney -- |g 6.2.4. |t FIB-ToF Tomography / |r Christine M. Mahoney / |r Gregory L. Fisher / |r Andreas Wucher -- |g 6.3. |t Important Considerations for Accurate 3D Representation of Data / |r Andreas Wucher / |r Gregory L. Fisher / |r Christine M. Mahoney -- |g 6.3.1. |t Beam Rastering Techniques / |r Christine M. Mahoney / |r Gregory L. Fisher / |r Andreas Wucher -- |g 6.3.2. |t Geometry Effects / |r Andreas Wucher / |r Christine M. Mahoney / |r Gregory L. Fisher -- |g 6.3.3. |t Depth Scale Calibration / |r Andreas Wucher / |r Gregory L. Fisher / |r Christine M. Mahoney -- |g 6.4. |t Three-Dimensional Image Reconstruction / |r Christine M. Mahoney / |r Andreas Wucher / |r Gregory L. Fisher -- |g 6.5. |t Damage and Altered Layer Depth / |r Christine M. Mahoney / |r Andreas Wucher / |r Gregory L. Fisher -- |g 6.6. |t Biological Samples / |r Gregory L. Fisher / |r Christine M. Mahoney / |r Andreas Wucher -- |g 6.7. |t Conclusions / |r Andreas Wucher / |r Christine M. Mahoney / |r Gregory L. Fisher -- |t References / |r Andreas Wucher / |r Christine M. Mahoney / |r Gregory L. Fisher -- |g 7.1. |t Introduction / |r Joe Bennett / |r Greg Gillen -- |g 7.2. |t Primary Particle[-]Substrate Interactions / |r Joe Bennett / |r Greg Gillen -- |g 7.2.1. |t Collisional Mixing and Depth Resolution / |r Joe Bennett / |r Greg Gillen -- |g 7.2.2. |t Transient Effects / |r Joe Bennett / |r Greg Gillen -- |g 7.2.3. |t Sputter-Induced Roughening / |r Joe Bennett / |r Greg Gillen -- |g 7.3. |t Possible Improvements in SIMS Depth Profiling-The Use of Cluster Primary Ion Beams / |r Joe Bennett / |r Greg Gillen -- |g 7.4. |t Development of Cluster SIMS for Depth Profiling Analysis / |r Joe Bennett / |r Greg Gillen -- |g 7.4.1. |t CF3+ Primary Ion Beams / |r Joe Bennett / |r Greg Gillen -- |g 7.4.2. |t NO2+ and O3+ Primary Ion Beams / |r Joe Bennett / |r Greg Gillen -- |g 7.4.3. |t SF5+ Polyatomic Primary Ion Beams / |r Joe Bennett / |r Greg Gillen -- |g 7.4.4. |t CSC6- and C8- Depth Profiling / |r Joe Bennett / |r Greg Gillen -- |g 7.4.5. |t Os3(CO)12 and Ir4(CO)12 Primary Ion Beams / |r Joe Bennett / |r Greg Gillen -- |g 7.4.6. |t C60+ Primary Ion Beams / |r Joe Bennett / |r Greg Gillen -- |g 7.4.7. |t Massive Gaseous Cluster Ion Beams / |r Joe Bennett / |r Greg Gillen -- |g 7.5. |t Conclusions and Future Prospects / |r Joe Bennett / |r Greg Gillen -- |t References / |r Joe Bennett / |r Greg Gillen -- |g 8.1. |t Introduction / |r Nick Winograd / |r John Vickerman -- |g 8.2. |t Capabilities of TOF-SIMS for Biological Analysis / |r Nick Winograd / |r John Vickerman -- |g 8.3. |t New Hybrid TOF-SIMS Instruments / |r Nick Winograd / |r John Vickerman -- |g 8.3.1. |t Introduction / |r Nick Winograd / |r John Vickerman -- |g 8.3.2. |t Benefits of New DC Beam Technologies / |r Nick Winograd / |r John Vickerman -- |g 8.4. |t Challenges in the Use of TOF-SIMS for Biological Analysis / |r Nick Winograd / |r John Vickerman -- |g 8.4.1. |t Sample Handling of Biological Samples for Analysis in Vacuum / |r Nick Winograd / |r John Vickerman -- |g 8.4.2. |t Analysis is Limited to Small to Medium Size Molecules / |r Nick Winograd / |r John Vickerman -- |g 8.4.3. |t Ion Yields Limit Useful Spatial Resolution for Molecular Analysis to not Much Better than 1 / |r Nick Winograd / |r John Vickerman -- |g 8.4.4. |t Matrix Effects Inhibit Application in Discovery Mode and Greatly Complicates Quantification / |r Nick Winograd / |r John Vickerman -- |g 8.4.5. |t Complexity of Biological Systems can Result in Data Sets that Need Multivariate Analysis (MVA) to Unravel / |r Nick Winograd / |r John Vickerman -- |g 8.5. |t Examples of Biological Studies Using Cluster-TOF-SIMS / |r John Vickerman / |r Nick Winograd -- |g 8.5.1. |t Analysis of Tissue / |r Nick Winograd / |r John Vickerman -- |g 8.5.2. |t Drug Location in Tissue / |r Nick Winograd / |r John Vickerman -- |g 8.5.3. |t Microbial Mat-Surface and Subsurface Analysis in Streptomyces / |r Nick Winograd / |r John Vickerman -- |g 8.5.4. |t Cells / |r Nick Winograd / |r John Vickerman -- |g 8.5.5. |t Depth Scale Measurement / |r Nick Winograd / |r John Vickerman -- |g 8.5.6. |t High Throughput Biomaterials Characterization / |r Nick Winograd / |r John Vickerman -- |g 8.6. |t Final Thoughts and Future Directions / |r Nick Winograd / |r John Vickerman -- |t Acknowledgments / |r Nick Winograd / |r John Vickerman -- |t References / |r Nick Winograd / |r John Vickerman -- |g 9.1. |t Introduction / |r Christine M. Mahoney / |r Peter Williams -- |g 9.2. |t Cluster Niche / |r Peter Williams / |r Christine M. Mahoney -- |g 9.3. |t Cluster Types / |r Peter Williams / |r Christine M. Mahoney -- |g 9.4. |t Challenge of Massive Molecular Ion Ejection / |r Christine M. Mahoney / |r Peter Williams -- |g 9.4.1. |t Comparing with MALDI: The Gold Standard / |r Peter Williams / |r Christine M. Mahoney -- |g 9.4.2. |t Particle Impact Techniques / |r Peter Williams / |r Christine M. Mahoney -- |g 9.5. |t Ionization / |r Peter Williams / |r Christine M. Mahoney -- |g 9.5.1. |t "Preformed" Ions / |r Christine M. Mahoney / |r Peter Williams -- |g 9.5.2. |t Radical Ions and Ion Fragments / |r Christine M. Mahoney / |r Peter Williams -- |g 9.5.3. |t Ionization Processes for Massive Clusters / |r Peter Williams / |r Christine M. Mahoney -- |g 9.6. |t Matrix Effects and Challenges in Quantitative Analysis / |r Christine M. Mahoney / |r Peter Williams -- |g 9.7. |t SIMS Instrumentation / |r Peter Williams / |r Christine M. Mahoney -- |g 9.7.1. |t Massive Cluster Ion Source Technology / |r Christine M. Mahoney / |r Peter Williams -- |g 9.8. |t Prospects for Biological Imaging / |r Peter Williams / |r Christine M. Mahoney -- |g 9.9. |t Conclusions / |r Christine M. Mahoney / |r Peter Williams -- |t References / |r Peter Williams / |r Christine M. Mahoney. |
| 590 | |a ProQuest Ebook Central |b Ebook Central Academic Complete | ||
| 650 | 0 | |a Secondary ion mass spectrometry. | |
| 650 | 6 | |a Spectrométrie de masse des ions secondaires. | |
| 650 | 7 | |a SCIENCE |x Chemistry |x Analytic. |2 bisacsh | |
| 650 | 7 | |a Secondary ion mass spectrometry |2 fast | |
| 758 | |i has work: |a Cluster secondary ion mass spectrometry (Text) |1 https://id.oclc.org/worldcat/entity/E39PCFGMKcv3b46pdhwhvMKbFq |4 https://id.oclc.org/worldcat/ontology/hasWork | ||
| 776 | 0 | 8 | |i Print version: |a Mahoney, Christine M. |t Cluster secondary ion mass spectrometry. |d Hoboken, New Jersey : John Wiley, ©2013 |z 0470886056 |w (OCoLC)816563294 |
| 856 | 4 | 0 | |u https://ebookcentral.uam.elogim.com/lib/uam-ebooks/detail.action?docID=1169505 |z Texto completo |
| 938 | |a Askews and Holts Library Services |b ASKH |n AH25495577 | ||
| 938 | |a ebrary |b EBRY |n ebr10687758 | ||
| 938 | |a EBSCOhost |b EBSC |n 566509 | ||
| 938 | |a ProQuest MyiLibrary Digital eBook Collection |b IDEB |n cis25340186 | ||
| 938 | |a Recorded Books, LLC |b RECE |n rbeEB00063935 | ||
| 938 | |a YBP Library Services |b YANK |n 9922332 | ||
| 938 | |a YBP Library Services |b YANK |n 10451037 | ||
| 938 | |a YBP Library Services |b YANK |n 12676427 | ||
| 994 | |a 92 |b IZTAP | ||