X-ray fluorescence spectrometry and related techniques : an introduction /

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X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable spe...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Marguí, Eva
Otros Autores: Grieken, R. van (René)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: [New York, N.Y.] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2013.
Temas:
X-ray spectroscopy.
Spectrometry, X-Ray Emission
Spectroscopie des rayons X.
x-ray spectroscopy.
SCIENCE > Physics > Electricity.
SCIENCE > Physics > Electromagnetism.
X-ray spectroscopy
X-ray fluorescence spectrometry (XRF)
Energy dispersive X-ray fluorescence spectrometry (EDXRF)
Wavelength dispersive X-ray fluorescence spectrometry (WDXRF)
Total reflection X-ray fluorescence spectrometry (TXRF)
Micro-XRF
Synchrotron radiation-induced X-ray emission (SRXRF)
Metals
Sample preparation
XRF instrumentation
Industrial analysis
Environmental analysis
Geochemical analysis
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Preface
  • Series preface
  • Series editor
  • About the authors.
  • 1. Introduction
  • 1.1 Basic principles of x-ray fluorescence
  • 1.2 Interactions of x-rays with matter
  • 1.3 X-ray safety and protection.
  • 2. Basic components of x-ray fluorescence spectrometers
  • 2.1 General introduction
  • 2.2 Excitation sources
  • 2.2.1 X-ray tubes
  • 2.2.2 Radioisotopes
  • 2.2.3 Other sources
  • 2.3 Sample chamber
  • 2.4 Detection system
  • 2.4.1 Types of detectors
  • 2.4.1.1 Gas-filled detectors
  • 2.4.1.2 Scintillation detectors
  • 2.4.1.3 Solid-state detectors
  • 2.4.2 Resolution and efficiency
  • 2.4.2.1 Resolution
  • 2.4.2.2 Efficiency
  • 2.4.3 Comparison of detection systems
  • 2.4.4 Detector artifacts
  • 2.4.4.1 Escape peaks
  • 2.4.4.2 Sum peaks (pile-up effect)
  • 2.4.5 Signal processing system
  • 2.5 Source and detector modifiers
  • 2.5.1 Filters
  • 2.5.1.1 Primary filters
  • 2.5.1.2 Detector filters
  • 2.5.2 Secondary targets
  • 2.5.3 Focusing optics
  • 2.5.4 Dispersing systems
  • 2.5.5 Collimators
  • 2.5.6 Masks
  • 2.6 Instrument configurations.
  • 3. Qualitative and quantitative x-ray fluorescence analysis
  • 3.1 Evaluation of x-ray fluorescence spectra
  • 3.2 Qualitative XRF analysis
  • 3.3 Quantitative XRF analysis
  • 3.3.1 Chemical matrix effects
  • 3.3.1.1 Absorption effects
  • 3.3.1.2 Enhancement effects
  • 3.3.2 Correction and compensation methods
  • 3.3.2.1 Compensation methods
  • 3.3.2.2 Matrix correction methods
  • 3.3.2.3 Overview of correction and compensation methods
  • 3.3.3 Quality of XRF analytical results
  • 3.3.3.1 Limits of detection (LOD) and quantification (LOQ)
  • 3.3.3.2 Working range and linearity
  • 3.3.3.3 Precision and accuracy
  • 3.3.3.4 Quality control of the results.
  • 4. Sample preparation procedures
  • 4.1 Introduction
  • 4.2 General sample preparation procedures
  • 4.2.1 Solid samples
  • 4.2.1.1 Direct XRF analysis
  • 4.2.1.2 Powdered specimen
  • 4.2.1.3 Fused specimen
  • 4.2.1.4 Digested specimen
  • 4.2.2 Liquid samples
  • 4.2.2.1 Preconcentration methods
  • 4.3 Specific sample preparation procedures.
  • 5. Wavelength/energy dispersive x-ray fluorescence spectrometry (WDXRF/EDXRF)
  • 5.1 Introduction and basic principles
  • 5.2 WDXRF and EDXRF layouts
  • 5.2.1 WDXRF instrumentation
  • 5.2.2 EDXRF instrumentation
  • 5.3 Comparison of WDXRF and EDXRF systems
  • 5.4 Applications of WDXRF and case studies
  • 5.4.1 Determination of metal residues in active pharmaceutical ingredients
  • 5.4.2 Determination of heavy metal content in automotive
  • shredder residues (ASR)
  • 5.4.3 Metal determination in polluted soils and waters
  • 5.5 Applications of EDXRF and case studies
  • 5.5.1 Determination of heavy metals at trace levels in vegetation samples
  • 5.5.2 Determination of Cu, Ni, Zn, Pb, and Cd in aqueous samples
  • 5.5.3 Chemical characterization of aerosol samples.
  • 6. Total Reflection X-Ray Spectrometry (TXRF)
  • 6.1 Introduction and basic principles
  • 6.2 TXRF layout
  • 6.3 Analytical capabilities of TXRF systems
  • 6.3.1 Chemical analysis
  • 6.3.1.1 Sample carriers
  • 6.3.1.2 Sample treatment procedures for chemical analysis by TXRF
  • 6.3.1.3 Quantification
  • 6.3.2 Surface analysis
  • 6.4 Other applications of TXRF and case studies
  • 6.4.1 Multielement determination in waste water effluents
  • 6.4.2 Determination of trace amounts of Se in soil samples
  • 6.4.3 Analysis of Si wafer surfaces.
  • 7. Special XRF configurations and related techniques
  • 7.1 Introduction
  • 7.2 Microbeam X-ray fluorescence spectrometry ([mu]-XRF)
  • 7.3 Synchrotron radiation-induced X-ray emission (SRXRF or SRIXE)
  • 7.4 Particle-induced X-ray emission (PIXE)
  • 7.5 Electron-induced X-ray emission
  • 7.5.1 Scanning electron microscope (SEM)
  • 7.5.2 Electron microprobe analysis (EMPA).
  • 8. Overview of XRF and related techniques
  • 8.1 Introduction
  • 8.2 Comparative performance of XRF systems
  • 8.3 Role of XRF spectrometry in analysis field
  • 8.4 Future perspectives.
  • Buyer's guide to manufacturers
  • Glossary of abbreviations and acronyms
  • References
  • Bibliography
  • Books and encyclopedia chapters
  • Journals
  • Index.

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