Constraint Solving over Multi-valued Logics : Application to Digital Circuits.

Systems are subject to faults in their components, affecting their overall behaviour. In a "black-box" system, such faults only become apparent in the output when appropriate inputs are given, which poses a number of satisfaction and optimization problems regarding both testing and diagnos...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Formato: Electrónico eBook
Idioma:Inglés
Publicado: IOS Press 2002.
Temas:
Integrated circuits > Mathematical models.
Digital electronics.
Circuits intégrés > Modèles mathématiques.
Électronique numérique.
Digital electronics
Integrated circuits > Mathematical models
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Cover
  • Title page
  • Table of Contents
  • Chapter 1. Introduction
  • 1.1 Scope
  • 1.2 Truth Maintenance Systems
  • 1.3 Constraint Reasoning
  • 1.3.1 Consistency Techniques
  • 1.3.2 Maintaining Consistency
  • 1.3.3 Advanced Techniques
  • 1.4 Contributions and Limitations
  • 1.4.1 Limitations
  • 1.5 Overview
  • Chapter 2. Circuit Modelling
  • 2.1 Introduction
  • 2.2 Logic Simulation
  • 2.3 Fault Modelling
  • 2.4 Benchmarks
  • 2.5 Our Modelling Approach
  • 2.6 Summary
  • Chapter 3. Test Patterns
  • 3.1 What are Test Patterns?
  • 3.2 Test Generation
  • 3.3 TG Modelling Approaches and Algorithms.
  • 3.3.1 Algebraic Models / Algorithms
  • 3.3.2 Topological Methods
  • 3.3.3 Multi-valued Logics
  • 3.3.4 TG Specialised Algorithms
  • 3.4 Constraint Reasoning
  • 3.4.1 CLP(B)
  • 3.4.2 CLP(FD)
  • 3.5 Heuristics
  • 3.5.1 Discussion and Potential Improvements
  • 3.6 Iterative Time-Bounded Search
  • 3.6.1 Conclusion
  • 3.7 Summary
  • Chapter 4. Differential Diagnosis
  • 4.1 Introduction
  • 4.2 Diagnosis Approaches
  • 4.3 Differential Diagnosis and Test Patterns
  • 4.4 The 8-valued Logic
  • 4.4.1 Boolean operations
  • 4.4.2 Modelling Alternative Diagnostic Theories in Digital Circuits.
  • 4.5 A 4-valued Logic for Differentiation
  • 4.6 A Constraint Solver for the 8-Valued Logic
  • 4.6.1 Domain Representation
  • 4.6.2 Not-Gates
  • 4.6.3 Xor-Gates
  • 4.6.4 Normal And-Gates
  • 4.6.5 S-Buffers
  • 4.6.6 Heuristics to Find Differential Patterns_
  • 4.7 Benchmarks
  • 4.7.1 Generating a Benchmark
  • 4.7.2 Set of Benchmarks Used
  • 4.8 Differentiating Multiple Diagnoses
  • 4.9 Experimental Results
  • 4.9.1 Choosing the Heuristic
  • 4.9.2 Discussion
  • 4.9.3 Complete Results
  • 4.9.4 Comparison of Results and Approaches
  • 4.10 Conclusions
  • Chapter 5. Problems with Multiple Diagnoses.
  • 5.1 Satisfaction Problems
  • 5.1.1 Fault Simulation
  • 5.1.2 Test Generation
  • 5.1.3 Fault Covering
  • 5.1.4 Covered Diagnoses
  • 5.1.5 Diagnosis
  • 5.1.6 Fault Location
  • 5.2 Optimisation Problems
  • 5.2.1 Minimal Set of Test Patterns
  • 5.2.2 Maximal Test Patterns
  • 5.2.3 Minimal Diagnosis
  • 5.2.4 Maximal Fault Resolution
  • 5.3 Logic over Booleans and Sets
  • 5.3.1 Signal Representation
  • 5.3.2 Normal Gates
  • 5.3.3 S-Buffers
  • 5.4 Modelling and Solving
  • 5.4.1 Diagnosis
  • 5.4.2 Differentiation
  • 5.4.3 Optimisation Problems
  • 5.5 Reduction to Set Algebra
  • 5.5.1 Motivation.
  • 5.5.2 Transformation
  • 5.5.3 Modelling
  • 5.6 Summary
  • Chapter 6. A New Set Constraint Solver: Cardinal
  • 6.1 Set Constraint Solving and Cardinality Inferences
  • 6.2 Intervals and Lattices
  • 6.3 Operational Semantics
  • 6.3.1 Set Variable
  • 6.3.2 Membership Constraints
  • 6.3.3 Set Complement
  • 6.3.4 Set Equality
  • 6.3.5 Set Inequality
  • 6.3.6 Disjointness
  • 6.3.7 Set Inclusion
  • 6.3.8 Set Intersection
  • 6.3.9 Set Union
  • 6.3.10 Set Difference
  • 6.4 Implementation
  • 6.4.1 Set Labelling
  • 6.5 Results
  • 6.6 Other Applications
  • 6.6.1 Steiner Triples
  • 6.6.2 Golfers.

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